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" Experimental and simulation study of gate controlled resistance switching memory "


Document Type : Latin Dissertation
Language of Document : English
Record Number : 804223
Doc. No : TL49045
Call number : ‭1844993705;‮ ‬10163525‬
Main Entry : Mian, Mohammad Rajibul Islam
Title & Author : Experimental and simulation study of gate controlled resistance switching memory\ Nurunnahar Islam MouTabib-Azar, Massood
College : The University of Utah
Date : 2016
Degree : M.S.
field of study : Electrical and Computer Engineering
student score : 2016
Page No : 92
Note : Committee members: Mastrangelo, Carlos; Simpson, Jamesina
Note : Place of publication: United States, Ann Arbor; ISBN=978-1-369-18216-3
Abstract : Scaling limitation of current memory technology requires invention of a new class of memory that has high density, fast programming and access time, as well as good nonvolatility. Resistive switching memories or memristors are good candidates for such application. Anticipated advantages of these devices include long retention time, high access speed, endurance, low power, high density, and scalability. Memristors were first proposed theoretically by L. Chua in 1971, but it did not come into practical implementation until 2008 when researchers in the HP lab fabricated and recognized the first ever memristor.
Subject : Electrical engineering
Descriptor : Applied sciences;Gated memristor;Memristor
Added Entry : Tabib-Azar, Massood
Added Entry : Electrical and Computer EngineeringThe University of Utah
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