| Document Type
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BL
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| Record Number
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1001344
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| Doc. No
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b755714
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| Main Entry
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Aliev, T. A.
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| Title & Author
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Digital noise monitoring of defect origin /\ Telman Aliev.
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| Publication Statement
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Berlin :: Springer,, ©2007.
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| Series Statement
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Lecture notes in electrical engineering ;; 2
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| Page. NO
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1 online resource (xii, 223 pages) :: illustrations
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| ISBN
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0387717536
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: 0387717544
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: 9780387717531
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: 9780387717548
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| Notes
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Book is intended for teachers, post-graduate students, and university students of all professions except the humanities. It deals with signals and noises at the output of sensors for both technical and biological objects at the origin of a defect.
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| Bibliographies/Indexes
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Includes bibliographical references (pages 217-220) and index.
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| Contents
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Difficulties of Monitoring a Defect at Its Origin and Its Dataware Features -- Position-Binary Technology of Monitoring Defect at its Origin -- Technology of Digital Analysis of Noise as a Carrier of Information about the Beginning of a Defect's Origin -- Robust Correlation Monitoring of a Defect at its Origin -- Spectral Monitoring of a Defect's Origin -- The Digital Technology of Forecasting Failures by Considering Noise as a Data Carrier -- The Technology of Monitoring a Defect's Origin by Considering Noise as a Data Carrier.
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| Abstract
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"Digital Noise Monitoring of Defect Origin is for both academics and professionals in the fields of engineering, biological sciences, physical science, and automation with particular emphasis on power engineering, oil-and-gas extraction, and aviation among others. The focus of the book is on determining defect origins. The author divides the process into the stages of monitoring the defect origin, identification of the defect and its stages, and control of the defect. The significance of this work is also connected to the possibility of using noise as a data carrier for creating technologies that detect the initial stage of changes in objects."--Jacket.
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| Subject
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Defect correction methods (Numerical analysis)
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Electronic noise-- Mathematical models.
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Information storage and retrieval systems-- Materials-- Defects.
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Signal detection.
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Defect correction methods (Numerical analysis)
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Electronic noise-- Mathematical models.
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Ingénierie.
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Signal detection.
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| Subject
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Defect correction methods (Numerical analysis)
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Electronic noise-- Mathematical models.
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Information storage and retrieval systems-- Materials-- Defects.
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| Subject
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Signal detection.
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| Dewey Classification
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621.382/24
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| LC Classification
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TK7867.5.A45 2007eb
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| NLM classification
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TN911. 4clc
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