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" Electron microscopy and analysis / "
Peter J. Goodhew, University of Liverpool, UK ; John Humphreys, Manchester Materials Science Centre, UK ; Richard Beanland, Marconi Materials Technology, Towcester, UK.
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BL
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| Record Number
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1013256
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b767626
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| Main Entry
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Goodhew, Peter J.
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| Title & Author
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Electron microscopy and analysis /\ Peter J. Goodhew, University of Liverpool, UK ; John Humphreys, Manchester Materials Science Centre, UK ; Richard Beanland, Marconi Materials Technology, Towcester, UK.
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| Edition Statement
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Third edition.
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| Publication Statement
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Boca Raton :: CRC Press, Taylor & Francis Group,, 2017.
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, ©2001
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| Page. NO
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1 online resource (x, 251 pages) :: illustrations
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| ISBN
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142001725X
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: 9781420017250
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0748409688
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1138441538
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9780748409686
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9781138441538
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| Bibliographies/Indexes
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Includes bibliographical references and index.
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| Contents
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Microscopy with light and electrons -- Electrons and their interaction with the specimen -- Electron diffraction -- The transmission electron microscope -- The scanning electron microscope -- Chemical analysis in the electron microscope -- Electron microscopy and other techniques.
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| Abstract
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Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context.
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| Subject
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Electron microscopy.
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| Subject
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Electron microscopy.
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SCIENCE / General.
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| Dewey Classification
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502/.8/25
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| LC Classification
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QH212.E4G62 2017
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| Added Entry
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Beanland, R.
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Humphreys, F. J.
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