A parallel testing algorithm for pattern sensitive faults in random access memory

منو

" A parallel testing algorithm for pattern sensitive faults in random access memory "
S. Lu M. Ashtijou

Document Type	:	Latin Dissertation
Language of Document	:	English
Record Number	:	1113221
Doc. No	:	TLpq230778141
Main Entry	:	M. Ashtijou
	:	S. Lu
Title & Author	:	A parallel testing algorithm for pattern sensitive faults in random access memory\ S. LuM. Ashtijou
College	:	Texas A&M University - Kingsville
Date	:	1994
student score	:	1994
Degree	:	M.S.
Page No	:	154
Abstract	:	A pattern sensitive fault recognition algorithm (PSFRA) is presented that not only detects and locates the neighborhood pattern sensitive faults (NPSF) but also it recognizes the types of the fault. A parallel testing structure for NPSF in Random Access Memory (RAM) has been developed in (1) to reduce overall test time and cost. It is designed for a broad class of pattern-sensitive faults and is significantly more efficient than previous approaches. The algorithm is modified to provide a fault type recognition capability that helps in differentiating between active, passive, and static NPSF for Type-1 and Type-2 neighborhood. The PSFRA needs 321 N write operations and 480 N read operations for Type-1 neighborhood, and it needs 129 N write operations and 192 N read operations for Type-2 neighborhood (N is the memory size). The recognition of fault is in expense of more test time and it is still more efficient than sequential algorithms.
Subject	:	Applied sciences
	:	Computer science
	:	Electrical engineering