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" Computed electron micrographs and defect identification "


Document Type : BL
Record Number : 572360
Doc. No : b401579
Title & Author : Computed electron micrographs and defect identification\ By A.K. Head, P. Humble, L.M. Clarebrough, a.o.
Publication Statement : Amsterdam :: North-Holland Pub. Co.,, 1973.
Series Statement : Defects in crystalline solids,; v. 7
Page. NO : 1 online resource (x, 400 pages :: illustrations).
ISBN : 9780720417579
: : 0720417570
: : 9780444601476
: : 0444601473
: 0444104623
: 9780444104625
Bibliographies/Indexes : Includes bibliographical references (p. [387]-389).
Subject : Metals-- Defects-- Data processing.
Subject : Electron microscopy-- Data processing.
Subject : physique.
Subject : identification défaut.
Subject : cristallographie.
Subject : dislocation.
Subject : diffraction.
Subject : Cristaux-- Défauts.
Subject : Électrons-- Diffraction.
Subject : Cristallographie-- Informatique.
Subject : SCIENCE-- Physics-- Crystallography.
Subject : Electron microscopy-- Data processing.
Subject : Metals-- Defects-- Data processing.
Subject : Roosterfouten.
Subject : Vastestoffysica.
Subject : Elektronendiffractie.
Subject : Elektronenmicroscopie.
Subject : Computersimulaties.
Subject : Metall.
Subject : Mikrostruktur.
Added Entry : Head, A. K.
Added Entry : ScienceDirect (Online service)
Parallel Title : Electron micrographs and defect identification
copyhttps://lib.clisel.com/site/catalogue/572360
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