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" Physics, Fabrication, and Applications of Multilayered Structures "
edited by P. Dhez, C. Weisbuch.
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BL
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| Record Number
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574528
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b403747
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| Main Entry
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Dhez, P.
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| Title & Author
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Physics, Fabrication, and Applications of Multilayered Structures\ edited by P. Dhez, C. Weisbuch.
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| Publication Statement
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Boston, MA :: Springer US :: Imprint: Springer,, 1988.
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| ISBN
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9781475700916
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: 9781475700930
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| Contents
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I: Growth and Characterization of Multilayer Structure -- Growth of Metallic and Metal-Containing Superlattices -- Multilayer Structures: Atomic Engineering in Its Infancy -- Molecular Beam Epitaxy of Artificially Layered Semiconductor Structures - Basic Concept and Recent Achievements -- The Structure of Multilayers: X-Ray Studies -- RHEED Oscillations in MBE and Their Applications to Precisely Controlled Crystal Growth -- II: Physics of Multilayer Structure -- Theoretical Background of Interfaces and Multilayers -- The Physics of Metallic Superlattices: An Experimental Point of View -- Semiconductor Interfaces -- Stability of Artificial Multilayers -- III-V Semiconductor Strained-Layer Superlattices -- Si/Ge Multilayered Structures -- III: Applications of Multilayer Structure -- Electronic Devices Using Multilayer Structures -- Multilayer Optics for X-Rays -- Multilayer Neutron Optical Devices -- Poster Session I: Structural Studies and Fabrication -- Xe Implanted Si Observed by Means of EXAFS -- TEM Methods for Characterising the Structure of Multilayered Materials -- Characterization of R.F. Sputtered Oxide Applications of Multilayered Structures in Optics -- Ion Beam Mixing in Metallic Superlattices -- The Initial Stages of Overlayer Growth Studied Using High Energy Electron Forward Scattering: Cr/Ag(100) -- Monte Carlo Calculations of Sputtering Processes -- X-Ray Diffraction Studies of Nb/Ta Superlattices -- Intensity Oscillations in Reflection High Energy Electron Diffraction During Molecular Beam Epitaxy of Metals on Metals and the Fabrication of Metallic Superlattices -- Crystallization and Melting in Multilayered Structures -- The Structure of Mo/Ta Superlattices -- Investigation of the Structural Properties of the CdTe-ZnTe Strained-Layer Superlattice System -- Elaboration and Characterization of Metallic Multilayers in the CNRS - St. Gobain Common Laboratory -- How to Observe Interfaces -- Studies of the Fabrication Conditions of a Variety of Metal Multilayers -- Growth and Characterization of Transition Metal Superlattices -- Interface Induces Loss of Coherence in Superlattices -- Some Characteristics of Multilayers Produced by Magnetron Sputtering Device -- Negative Differential Resistance (NDR) Measurements -- The Solid State Reaction in Multilayers Studies by XAS -- Growth, Properties and Characterisation of Metal Multilayers -- Poster Session II: Design Tests and Miscellaneous Applications -- X-Ray Optics in Langmuir-Blodgett Films -- Figured Multilayer Structures Applied to a Laser Produced Plasma -- Localization Effects in Multilayers of Metallic Glasses -- Numerical Determination of the Reflectivity of Multilayered Neutron Mirrors -- New Fast Technique for Electronic Structure Calculations of Complex Layered Materials -- Superconductivity of Regular and Fibonacci Mo/V Superlattices -- Radiative and Non-Radiative Polariton Structure of Superlattices -- Electronic Structure of Stained Sin/Gen(001) Superlattices -- Electronic Properties of CuO2 Layers in High Tc Materials -- Electrical Characterisation of Thin Insulating Langmuir Blodgett Films Incorporated in Metal-Insulator-Metal Structures -- Lattice Deformation and Misorientation of GaAs Layers Grown on (100) Si by Molecular Beam Epitaxy -- X-UV Polarizer Based on Multilayered Mirrors -- Strain Measurements in Si/Si0.5Ge0.5 and W/Mo Superlattices by He Ion Channeling -- Reflection of Very Low Energy Electrons by Indium/Gold Bilayers -- MBE Growth of Magnetic Multilayers -- Reflectivity and Roughness of Multilayer Mirrors -- Electric Field Dependent Exciton Energy; Photoluminescence Quenching and Nonlinear Absorption in GaInAs/InP Quantum Wells -- Enhanced Hole Mobility in Si Doping Superlattices -- Structural Investigations of Mo-Ge Multilayers by X-Ray Anomalous Scattering and EXAFS -- The Molecular Beam Epitaxial Growth of GaAs on Si -- Poster Session III: Magnetic Multilayers -- Magnetic Anisotropy in Modulated Nd-Fe Multilayers -- Structure and Magnetic Properties of Cobalt Ultrathin Films -- Magnetic Properties of Pd/Co Multilayers -- Preparation and Magnetic Properties of Rare-Earth-Transition Metal Thin Films and Multilayers: A Starting Project -- Electrodeposited Co-P Amorphous Multilayers: A Study of Magnetoelastic Properties -- Interactions in Two-Layer Magnetic Films -- Static and Dynamic Characterization of Interfacial Anisotropy in Magnetic Superlattices -- Crystal Structure and Magnetic Characteristics of Tb/Fe Multilayers -- Theory of Ferromagnetic Multilayers -- Preparation and Characterization of Metallic Magnetic Superlattices -- Materials Index.
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| Abstract
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Low-dimensional materials are of fundamental interest in physics and chemistry and have also found a wide variety of technological applica tions in fields ranging from microelectronics to optics. Since 1986, several seminars and summer schools devoted to low-dimensional systems have been supported by NATO. The present one, Physics, Fabrication and Applications of Multilayered structures, brought together specialists from different fields in order to review fabrication techniques, charac terization methods, physics and applications. Artificially layered materials are attractive because alternately layering two (or more) elements, by evaporation or sputtering, is a way to obtain new materials with (hopefully) new physical properties that pure materials or alloys do not allow. These new possibilities can be ob tained in electronic transport, optics, magnetism or the reflectivity of x-rays and slow neutrons. By changing the components and the thickness of the layers one can track continuously how the new properties appear and follow the importance of the multilayer structure of the materials. In addition, with their large number of interfaces the study of inter face properties becomes easier in multilayered structures than in mono layers or bilayers. As a rule, the role of the interface quality, and also the coupling between layers, increases as the thickness of the layer decreases. Several applications at the development stage require layer thicknesses of just a few atomic layers.
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| Subject
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Physics.
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Weisbuch, C.
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SpringerLink (Online service)
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