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" Advanced Computing in Electron Microscopy "
by Earl J. Kirkland.
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BL
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| Record Number
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574602
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b403821
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| Main Entry
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Kirkland, Earl J.
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| Title & Author
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Advanced Computing in Electron Microscopy\ by Earl J. Kirkland.
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| Publication Statement
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Boston, MA :: Springer US :: Imprint: Springer,, 1998.
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| ISBN
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9781475744064
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: 9781475744088
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| Contents
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1 Introduction -- 2 The Transmission Electron Microscope -- 3 Linear Image Approximations -- 4 Sampling and the Fast Fourier Transform -- 5 Simulating Images of Thin Specimens -- 6 Simulating Images of Thick Specimens -- 7 Multislice Applications and Examples -- 8 The Programs on the CD-ROM -- A Plotting CTEM/STEM Transfer Functions -- B Files on the CD-ROM -- C The Fourier Projection Theorem -- D Atomic Potentials and Scattering Factors -- D.1 Atomic Charge Distribution -- D.2 X-Ray Scattering Factors -- D.3 Electron Scattering Factors -- D.4 Parameterization -- E Bilinear Interpolation -- F 3D Perspective View.
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| Abstract
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pending
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| Subject
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Engineering.
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Computer engineering.
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Optical materials.
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Surfaces (Physics).
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SpringerLink (Online service)
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