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" Introduction to Analytical Electron Microscopy "
edited by John J. Hren, Joseph I. Goldstein, David C. Joy.
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BL
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| Record Number
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574621
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b403840
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| Main Entry
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Hren, John J.
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| Title & Author
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Introduction to Analytical Electron Microscopy\ edited by John J. Hren, Joseph I. Goldstein, David C. Joy.
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| Publication Statement
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Boston, MA :: Springer US :: Imprint: Springer,, 1979.
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| ISBN
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9781475755817
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: 9781475755831
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| Contents
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Chpater 1 Principles of Image Formation -- Chpater 2 Introductory Electron Optics -- Chpater 3 Principles of Thin Film X-Ray Microanalysis -- Chpater 4 Quantitative X-Ray Microanalysis: Insturmental Considerations and Applications to Materials Science -- Chpater 5 EDS Quantitation and Application to Biology -- Chpater 6 Monte Carlo Simulation in Analytical Electron Microscopy -- Chpater 7 The Basic Principles of Electron Energy Loss Spectroscopy -- Chpater 8 Energy Loss Spectrometry for Biological Research -- Chpater 9 Elemental Analysis Using Inner-Shell Excitations: A Microanalytical Technique for materials Characterization -- Chpater 10 Analysis of the Electronic Structure of Solids -- Chpater 11 Stem Imaging of Crystals and Defects -- Chpater 12 Biological Scanning Transmission Electron Microscopy -- Chpater 13 Electron Microscopy of Individual Atoms -- Chpater 14 microdiffraction -- Chpater 15 Convergent Beam Electron Diffraction -- Chpater 16 Radiation Damage with Biological Specimens and Organic Materials -- Chpater 17 Radiation Effects in Analysis of Inorganic Specimens by TEM -- Chpater 18 Barriers to AEM: Contamination and Etching -- Chpater 19 Microanalysis by Lattice Imaging -- Chpater 20 Weak-Beam Microscopy -- Chpater 21 The Analysis of Defects Using Computer Simulated Images -- Chpater 22 The Strategy of Analysis.
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Surfaces (Physics).
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Goldstein, Joseph I.
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Joy, David C.
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SpringerLink (Online service)
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