رکورد قبلیرکورد بعدی

" RF and microwave modeling and measurement techniques for field effect transistors "


Document Type : BL
Record Number : 576141
Doc. No : b405360
Main Entry : Gao, Jianjun,1968-
Title & Author : RF and microwave modeling and measurement techniques for field effect transistors\ Jianjun Gao.
Publication Statement : Raleigh, NC :: SciTech Pub.,, c2010.
Page. NO : x, 339 p. :: ill. ;; 24 cm.
ISBN : 9781613442869
: : 1613442866
Bibliographies/Indexes : Includes bibliographical references and index.
Contents : Representation of Microwave Two-Port Network -- Microwave and RF Measurement Techniques -- FET Small Signal Modeling and Parameter Extraction -- FET Nonlinear Modeling and Parameter Extraction -- Microwave Noise Modeling and Parameter Extraction Technique for FETs -- Artificial Neural Network Modeling Technique for FET
Abstract : "This book is an introduction to microwave and RF signal modeling and measurement techniques for field effect transistors. It assumes only a basic course in electronic circuits and prerequisite knowledge for readers to apply the techniques and improve the performance of integrated circuits, reduce design cycles and increase their chance at first time success.
: The first chapters offer a general overview and discussion of microwave signal and noise matrices, and microwave measurement techniques. The following chapters address modeling techniques for field effect transistors and cover models such as: small signal, large signal, noise, and the artificial neural network based."--pub. desc.
Subject : Field-effect transistors-- Testing.
Subject : Compound semiconductors-- Testing.
Subject : Field-effect transistors-- Mathematical models.
Subject : Compound semiconductors-- Mathematical models.
Subject : Microwave measurements.
Subject : Radio measurements.
Added Entry : Knovel (Firm)
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