Test and diagnosis of analogue, mixed-signal and RF integrated circuits

" Test and diagnosis of analogue, mixed-signal and RF integrated circuits "
edited by Yichuang Sun.

Document Type	:	BL
Record Number	:	576231
Doc. No	:	b405450
Title & Author	:	Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach /\ edited by Yichuang Sun.
Publication Statement	:	London :: Institution of Engineering and Technology,, 2008.
Series Statement	:	Circuits, devices and systems series ;; 19
ISBN	:	9781615833153
	:	: 1615833153
Bibliographies/Indexes	:	Includes bibliographical references and index.
Subject	:	Linear integrated circuits-- Testing.
Subject	:	Mixed signal circuits-- Testing.
Subject	:	Radio frequency integrated circuits-- Testing.
Added Entry	:	Sun, Yichuang.
Added Entry	:	Knovel (Firm)
	:	Institution of Engineering and Technology.

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