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" Noncontact Atomic Force Microscopy "
edited by S. Morita, R. Wiesendanger, E. Meyer.
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BL
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| Record Number
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578094
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b407313
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| Main Entry
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Morita, S.
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| Title & Author
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Noncontact Atomic Force Microscopy\ edited by S. Morita, R. Wiesendanger, E. Meyer.
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| Publication Statement
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Berlin, Heidelberg :: Springer Berlin Heidelberg :: Imprint: Springer,, 2002.
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| Series Statement
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NanoScience and Technology,
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| ISBN
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9783642560194
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: 9783642627729
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| Contents
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Introduction -- Principles of NC-AFM -- Semiconductor Surfaces -- Bias Dependence of NC-AFM Images and Tunneling Current Variations on Semiconductors -- Alkali Halides -- Atomic Resolution Imaging on Fluorides -- Atomically Resolved Imaging of a NiO(001) Surface -- Atomic Structure, Order and Disorder of High-Temperature Reconstructed alpha-Al2O3(0001) -- NC-AFM Imaging of Surface Reconstructions and Metal Growth on Oxides -- Atoms and Molecules on TiO2(110) and CeO2(111) Surfaces-. NC-AFM Imaging of Adsorbed Molecules -- Organic Molecular Films -- Single-Molecule Analysis -- Low-Temperature Measurements: Principles, Instrumentation, and Application -- Theory of NC-AFM -- Chemical Interaction in NC-AFM on Semiconductor Surfaces -- Contrast Mechanisms on Insulating Surfaces -- Analysis of Microscopy and Spectroscopy Experiments -- Theory of Energy Dissipation into Surface Vibrations -- Measurement of Dissipation Induced by Tip-Sample Interactions.
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| Abstract
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Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.
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Nanotechnology.
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Surfaces (Physics).
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Wiesendanger, R.
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Meyer, E.
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SpringerLink (Online service)
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