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" Electronics reliability and measurement technology : "


Document Type : BL
Record Number : 586579
Doc. No : b415798
Title & Author : Electronics reliability and measurement technology : : nondestructive evaluation /\ edited by Joseph S. Heyman
Publication Statement : Park Ridge, N.J., U.S.A. :: Noyes Data Corp.,, c1988
Page. NO : xii, 128 p. :: ill. ;; 26 cm
ISBN : 081551171X :
Notes : "The Electronics Reliability and Measurement Technology Workshop was held in June 1986 at NASA Langley Research Center"--Preface
Bibliographies/Indexes : Includes bibliographical references and index
Subject : Integrated circuits-- Testing-- Congresses
Subject : Integrated circuits-- Reliability-- Congresses
Subject : Nondestructive testing-- Congresses
Dewey Classification : ‭621.381/028/7‬
LC Classification : ‭TK7874‬‭.E486 1988‬
Added Entry : Heyman, Joseph S
Added Entry : Electronics Reliability and Measurement Technology Workshop(1986 :, NASA Langley Research Center)
copyhttps://lib.clisel.com/site/catalogue/586579
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