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" Value analysis tear-down : "


Document Type : BL
Record Number : 587632
Doc. No : b416851
Main Entry : Sato, Yoshihiko
Title & Author : Value analysis tear-down : : a new process for product development and innovation /\ Yoshihiko Sato and J. Jerry Kaufman
Edition Statement : 1st ed
Publication Statement : New York :: Industrial Press :: Society of Manufacturing Engineers,, 2005
Page. NO : x, 206 p. :: ill. ;; 24 cm
ISBN : 0831132035 (professional/textbook : alk. paper)
Bibliographies/Indexes : Includes bibliographical references (p. 199) and index
Subject : Value analysis (Cost control)
Subject : Industrial productivity
Subject : New products
Subject : Engineering economy
Dewey Classification : ‭658.5/75‬
LC Classification : ‭HD47.3‬‭.S38 2005‬
Added Entry : Kaufman, J. Jerry
copyhttps://lib.clisel.com/site/catalogue/587632
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