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" Microelectronic failure analysis : "


Document Type : BL
Record Number : 588110
Doc. No : b417329
Title & Author : Microelectronic failure analysis : : desk reference : 2001 supplement /\ prepared under the direction of the Electronic Device Failure Analysis Society Publications Committee
Publication Statement : Materials Park, Ohio :: ASM International,, c2001
Page. NO : v, 171 p. :: ill. ;; 28 cm. ++ 1 CD-ROM (4 3/4 in.)
ISBN : 0871707454 (pbk.)
Bibliographies/Indexes : Includes bibliographical references and index
Subject : Electronics-- Materials-- Testing, Handbooks, manuals, etc
Subject : Microelectronics-- Materials-- Testing, Handbooks, manuals, etc
Subject : Microelectronics-- Materials-- Defects, Handbooks, manuals, etc
Subject : Electronic apparatus and appliances-- Testing, Handbooks, manuals, etc
Subject : Semiconductors-- Defects, Handbooks, manuals, etc
Added Entry : Electronic Device Failure Analysis Society
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