|
" Microelectronic failure analysis : "
prepared under the direction of the Electronic Device Failure Analysis Society Publications Committee
Document Type
|
:
|
BL
|
Record Number
|
:
|
588110
|
Doc. No
|
:
|
b417329
|
Title & Author
|
:
|
Microelectronic failure analysis : : desk reference : 2001 supplement /\ prepared under the direction of the Electronic Device Failure Analysis Society Publications Committee
|
Publication Statement
|
:
|
Materials Park, Ohio :: ASM International,, c2001
|
Page. NO
|
:
|
v, 171 p. :: ill. ;; 28 cm. ++ 1 CD-ROM (4 3/4 in.)
|
ISBN
|
:
|
0871707454 (pbk.)
|
Bibliographies/Indexes
|
:
|
Includes bibliographical references and index
|
Subject
|
:
|
Electronics-- Materials-- Testing, Handbooks, manuals, etc
|
Subject
|
:
|
Microelectronics-- Materials-- Testing, Handbooks, manuals, etc
|
Subject
|
:
|
Microelectronics-- Materials-- Defects, Handbooks, manuals, etc
|
Subject
|
:
|
Electronic apparatus and appliances-- Testing, Handbooks, manuals, etc
|
Subject
|
:
|
Semiconductors-- Defects, Handbooks, manuals, etc
|
Added Entry
|
:
|
Electronic Device Failure Analysis Society
|
| |