منو
رکورد قبلیرکورد بعدی

" System-on-chip test architectures "


Document Type : BL
Record Number : 596268
Doc. No : b425487
Title & Author : System-on-chip test architectures : nanometer design for testability /\ edited by Laung-Terng Wang, Charles E. Stroud, Nur A. Touba
Publication Statement : Amsterdam ;Boston :: Morgan Kaufmann Publishers,, c2008
Series Statement : The Morgan Kaufmann series in systems on silicon
Page. NO : xxxvi, 856 p. :: ill. ;; 25 cm
ISBN : 9780123739735
: : 012373973X
Bibliographies/Indexes : Includes bibliographical references and index
Subject : Systems on a chip-- Testing
Subject : Integrated circuits-- Very large scale integration-- Testing
Subject : Integrated circuits-- Very large scale integration-- Design
LC Classification : ‭TK7895.E42‬‭S978 2008‬
Added Entry : Wang, Laung-Terng
: Stroud, Charles E
: Touba, Nur A
Added Entry : Ohio Library and Information Network
copyhttps://lib.clisel.com/site/catalogue/596268
کپی لینک
پیشنهاد خرید
پیوستها
Search result is zero
نظرسنجی
نظرسنجی منابع دیجیتال

1 - آیا از کیفیت منابع دیجیتال راضی هستید؟