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" Desorption mass spectrometry : "
Philip A. Lyon, editor.
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BL
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| Record Number
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599233
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b428452
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| Title & Author
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Desorption mass spectrometry : : are SIMS and FAB the same? : developed from a symposium sponsored by 3M, the National Science Foundation Midwest Center for Mass Spectrometry at the University of Nebraska--Lincoln, and the National Science Foundation Regional Facility for Surface Analysis at the University of Minnesota, St. Paul, Minnesota, Oct. 7-10, 1984 /\ Philip A. Lyon, editor.
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| Publication Statement
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Washington, D.C. :: American Chemical Society,, 1985.
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| Series Statement
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ACS symposium series,; 291
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| Page. NO
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viii, 248 pages :: illustrations ;; 24 cm.
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| ISBN
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0841209421
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: 9780841209428
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| Bibliographies/Indexes
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Includes bibliographical references and indexes.
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| Contents
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Molecular secondary ion mass spectrometry / Steven J. Pachuta and R. Graham Cooks -- Particle bombardment as viewed by molecular dynamics / Barbara J. Garrison -- Role of intermolecular interactions in the desorption of molecular ions from surfaces / Ronald D. Macfarlane -- Processes of laser-induced ion formation in mass spectrometry / F. Hillenkamp, M. Karas, and J. Rosmarinowsky -- Angle-resolved secondary ion mass spectrometry / Nicholas Winograd -- Secondary ion mass spectrometer design considerations for organic and inorganic analysis / C.W. Magee -- Liquid metal ion sources / Douglas F. Barofsky -- Fast atom bombardment mass spectrometry technique and ion guns / Julius Perel -- Fast atom bombardment secondary ion mass spectrometry surface analysis / J.A. Leys -- Secondary ion mass spectrometry : a multidimensional technique / Richard J. Colton, David A. Kidwell, George O. Ramseyer, and Mark M. Ross -- Fast atom bombardment combined with tandem mass spectrometry for the study of collisionally induced remote charge site decompositions / Nancy J. Jensen, Kenneth B. Tomer, Michael L. Gross, and Philip A. Lyon -- Analysis of reactions in aqueous solution using fast atom bombardment mass spectrometry / Richard M. Caprioli -- Applications of fast atom bombardment in bioorganic chemistry / Dudley H. Williams -- Use of secondary ion mass spectrometry to study surface chemistry of adhesive bonding materials / W.L. Baun.
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| Subject
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Field desorption mass spectrometry, Congresses.
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| Subject
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Secondary ion mass spectrometry, Congresses.
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| LC Classification
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QD96.M3D47 1985
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| Added Entry
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Lyon, Philip A.,1945-
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American Chemical Society.
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