رکورد قبلیرکورد بعدی

" Scanning probe microscopy of polymers / "


Document Type : BL
Record Number : 599544
Doc. No : b428763
Title & Author : Scanning probe microscopy of polymers /\ Buddy D. Ratner, editor, Vladimir V. Tsukruk, editor
Series Statement : ACS symposium series,; 694
Page. NO : xii, 367 pages :: illustrations ;; 24 cm
ISBN : 0841235627
: : 9780841235625
Notes : "Developed from a symposium sponsored by the Division of Polymer Chemistry, at the 212th National Meeting of the American Chemical Society, Orlando, FL, August 25-29, 1996."
Bibliographies/Indexes : Includes bibliographical references and indexes
Contents : Scanning probe microscopy in polymers : introductory notes / René M. Overney and Vladimir V. Tsukruk -- Morphology, folding, and the structure of polymer single crystals / D.H. Reneker and I. Chun -- Atomic force investigations of epitaxially crystallized tactic poly(propylenes) / Wolfgang Stocker, Andrew J. Lovinger, Martina Schumacher, Sabine Graff, Jean-Claude Wittmann, and Bernard Lotz -- Morphology, chain packing, and conformation in uniaxially oriented polymers studied by scanning force microscopy / G.J. Vansco, H. Schönherr, and D. Snétivy -- The formation of fibrillar structures from biopolymers / M.C. Goh, M.F. Paige, P. Markiewicz, I. Yadegari, and M. Edirisinghe -- Deformation induced changes in surface properties of polymers investigated by scanning force microscopy / S. Hild, A. Rosa, and O. Marti -- Scanning probe microscopy: a useful tool for the analysis of carbon black-filled polymer blends / Ph. Leclère, R. Lazzaroni, R. Lazzaroni, F. Gubbels, M. De Vos, R. Deltour, R. Jérôme, and J.L. Bredas -- Effect of thermal and solvent treatments upon thermoplastic olefin surface morphology and composition studied with surface-sensitive techniques / M.P. Everson, M. Mikulec, and P. Schmitz -- Scanning force microscopy of conjugated anisotropic thin films grown in high-vacuum / Fabio Biscarini -- Atomic force microscopy of soft samples : gelatin and living cells / Jan Domke, Christian Rotsch, Paul K. Hansma, Ken Jacobson, and Manfred Radmacher -- Atomic force-, confocal laser scanning-, and scanning electron microscopy characterization of the surface degradation of a polymer / Ch. Bourban, J. Mergaert, K. Ruffieux, J. Swings, and E. Wintermantel -- Scanning force microscopy of surface structure and surface mechanical properties of organotrichlorosilane monolayers prepared by Langmuir method / Atsushi Takahara, Shouren Ge, Ken Kojio, and Tisato Kajiyama -- Optical and structural properties of Langmuir-Blodgett films at the air-water and the air-solid interface / L.M. Eng -- Atomic force microscopy of Langmuir-Blodgett films polymerized as a floating monolayer / Jouko Peltonen and Tapani Viitala -- Quantitative probing in atomic force microscopy of polymer surfaces / Valery N. Bliznyuk, John L. Hazel, John Wu, and Vladimir V. Tsukruk -- Stretching a network of entangled polymer chains with a nanotip / J.P. Aimé and S. Gauthier -- Correlating polymer viscoelastic properties with friction measures by scanning probe microscopy / Jon A. Hammerschmidt, Greg Haugstad, Bahram Moasser, Richard R. Jones, and Wayne L. Gladfelter -- Resolution limits of force microscopy / R. Lüthi, Meyer, M. Bammerlin, A. Baratoff, J. Lü, M. Guggisberg, and H.-J. Güntherodt -- Chemical force microscopy : probing and imaging interactions between functional groups / Dmitri V. Vezenov, Aleksandr Noy, and Charles M. Lieber -- pH variations of surface forces as probed by chemically modified tips / Vladimir V. Tsukruk, Valery N. Bliznyuk, and John Wu -- Recognition and nanolithography with the atomic force microscope / T. Boland, E.E. Johnston, A. Huber, and Buddy D. Ratner
Subject : Polymers-- Surfaces, Congresses
Subject : Polymers-- Microscopy, Congresses
Subject : Scanning probe microscopy, Congresses
Dewey Classification : ‭547.7‬
LC Classification : ‭QD381.9.S97‬‭S23 1998‬
Added Entry : Ratner, B. D., (Buddy D.),1947-
: T͡Sukruk, V. V., (Vladimir Vasilʹevich)
Added Entry : American Chemical Society., Division of Polymer Chemistry
: American Chemical Society., Meeting(212th :1996 :, Orlando, Fla.)
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