رکورد قبلیرکورد بعدی

" Theoretical concepts of x-ray nanoscale analysis : "


Document Type : BL
Record Number : 605805
Doc. No : b435024
Main Entry : Benediktovich, Andrei
Title & Author : Theoretical concepts of x-ray nanoscale analysis : : theory and applications /\ Andrei Benediktovich, Ilya Feranchuk, Alexander Ulyanenkov
Series Statement : Springer Series in Materials Science,; v.183
Page. NO : 1 online resource (xiii, 318 pages) :: illustrations (some color)
ISBN : 3642381774 (electronic bk.)
: : 9783642381775 (electronic bk.)
: 9783642381768
Bibliographies/Indexes : Includes bibliographical references and index
Contents : Basic principles of the interaction between X-rays and matter -- X-ray reflectivity -- High-resolution X-ray diffraction -- Grazing-incidence small-angle X-ray scattering -- Theory of X-ray scattering from imperfect crystals -- X-ray diffraction for evaluation of residual stresses in polycrystals -- Methods of mathematical and physical optimization of X-ray data analysis
Abstract : This book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in detail: high-resolution X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering and X-ray residual stress analysis. All the theoretical methods presented use the unified physical approach. This makes the book especially useful for readers learning and performing data analysis with different techniques. The theory is applicable to studies of bulk materials of all kinds, including single crystals and polycrystals as well as to surface studies under grazing incidence. The book appeals to researchers and graduate students alike
Subject : Nanostructured materials
Subject : X-rays-- Industrial applications
Subject : Physics
Subject : Applied and Technical Physics
Subject : Characterization and Evaluation of Materials
Subject : Measurement Science and Instrumentation
Subject : Spectroscopy and Microscopy
Subject : Theoretical, Mathematical and Computational Physics
Dewey Classification : ‭620.1/1272‬
LC Classification : ‭TA417.25‬
Added Entry : Feranchuk, I. D., (Ilya D.)
: Ulyanenkov, Alexander P.
Added Entry : Ohio Library and Information Network
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