| Document Type
|
:
|
BL
|
| Record Number
|
:
|
607343
|
| Doc. No
|
:
|
dltt
|
| Title & Author
|
:
|
Microelectronics failure analysis : desk reference /\ edited by Richard J. Ross ; EDFAS, ASM International.
|
| Edition Statement
|
:
|
6th ed.
|
| Publication Statement
|
:
|
Materials Park, Ohio :: ASM International,, c2011.
|
| Page. NO
|
:
|
1 online resource (xi, 660 p.) :: ill.
|
| ISBN
|
:
|
9781613447598 (electronic bk.)
|
|
|
:
|
: 1613447590 (electronic bk.)
|
|
|
:
|
: 9781615037261 (electronic bk.)
|
|
|
:
|
: 1615037268 (electronic bk.)
|
|
|
:
|
161503725X
|
|
|
:
|
9781615037254
|
|
|
:
|
9781615037261 (e-book)
|
| Notes
|
:
|
"ASM International, 2011, no. 09110Z"--P. 4 of cover.
|
|
|
:
|
Some online versions lack accompanying media packaged with the printed version.
|
| Bibliographies/Indexes
|
:
|
Includes bibliographical references and indexes.
|
| Contents
|
:
|
Section 1. Introduction -- section 2. Failure analysis process overviews -- section 3. Failure analysis topics -- section 4. Fault verification and classification -- section 5. Localization techniques -- section 6. Deprocessing and sample preparation -- section 7. Inspection -- section 8. Materials analysis -- section 9. Focused ion beam applications -- section 10. Management and reference information.
|
| Subject
|
:
|
Microelectronics-- Materials-- Testing, Handbooks, manuals, etc.
|
| Subject
|
:
|
Microelectronics-- Defects-- Testing, Handbooks, manuals, etc.
|
| Subject
|
:
|
Electronic apparatus and appliances-- Testing, Handbooks, manuals, etc.
|
| Subject
|
:
|
Electronics-- Materials-- Testing, Handbooks, manuals, etc.
|
| Subject
|
:
|
Electronics-- Materials-- Defects, Handbooks, manuals, etc.
|
| Dewey Classification
|
:
|
621.381
|
| LC Classification
|
:
|
TK7871.M52 2011eb
|
| Added Entry
|
:
|
Ross, Richard J.
|
| Added Entry
|
:
|
ASM International.
|
|
|
:
|
Electronic Device Failure Analysis Society.
|
|
|
:
|
Knovel (Firm)
|
| Parallel Title
|
:
|
Microelectronics failure analysis desk reference.
|