| Document Type
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BL
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| Record Number
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638576
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| Doc. No
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dltt
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| Main Entry
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International Symposium for Testing and Failure Analysis(25th :1999 :, Santa Clara, Calif.)
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| Title & Author
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ISTFA '99 : : proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California
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| Publication Statement
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Materials Park, Ohio :: ASM International,, c1999
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| Page. NO
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xvii, 486 p. :: ill. ;; 27 cm ++ 1 computer laser optical disc (4 3/4 in.)
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| ISBN
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0871706466
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| Notes
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Sponsored by EDFAS, ISTFA
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| Bibliographies/Indexes
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Includes bibliographical references and index
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| Subject
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Electronics-- Materials-- Testing, Congresses
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| Subject
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Electronic apparatus and appliances-- Testing, Congresses
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| Added Entry
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ASM International
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Electronic Device Failure Analysis Society
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| Parallel Title
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Proceedings of the 25th International Symposium or Testing and Failure Analysis
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: Conference Proceedings from the 25th International Symposium for Testing and Failure Analysis
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