| Document Type
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BL
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| Record Number
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638582
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| Doc. No
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dltt
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| Main Entry
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International Symposium for Testing and Failure Analysis(26th :2000 :, Bellevue, Wash.)
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| Title & Author
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ISTFA 2000 : : proceedings of the 26th International Symposium for Testing and Failure Analysis : 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington
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| Publication Statement
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Materials Park, Ohio :: ASM International,, c2000
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| Page. NO
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xvi, 577 p. :: ill. ;; 27 cm ++ 1 computer laser optical disc (4 3/4 in.)
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| ISBN
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0871707012
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| Notes
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Sponsored by EDFAS, ISTFA
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| Bibliographies/Indexes
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Includes bibliographical references and index
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| Subject
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Electronics-- Materials-- Testing, Congresses
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| Subject
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Electronic apparatus and appliances-- Testing, Congresses
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| Added Entry
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ASM International
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Electronic Device Failure Analysis Society
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| Parallel Title
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Proceedings of the 26th International Symposium or Testing and Failure Analysis
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: Conference Proceedings from the 26th International Symposium for Testing and Failure Analysis
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