| Document Type
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BL
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| Record Number
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638595
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| Doc. No
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dltt
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| Main Entry
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International Symposium for Testing and Failure Analysis(29th :2002 :, Santa Clara, Calif.)
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| Title & Author
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ISTFA 2003 : : proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California /\ sponsored by EDFAS
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| Publication Statement
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Materials Park, Ohio :: ASM International,, 2003
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| Page. NO
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xviii, 518 p. :: ill. ;; 28 cm. +
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| ISBN
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0871707888
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| Bibliographies/Indexes
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Includes bibliographical references and index
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| Subject
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Electronics-- Materials-- Testing, Congresses
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| Subject
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Electronic apparatus and appliances-- Testing, Congresses
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| Added Entry
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ASM International
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Electronic Device Failure Analysis Society
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| Parallel Title
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Proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003
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| Cover Title
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Conference proceedings from the 29th International Symposium for Testing and Failure Analysis
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