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" Microelectronics failure analysis : "
edited by The Electronic Device Failure Analysis Society, Desk Reference Committee
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BL
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| Record Number
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638596
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| Doc. No
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dltt
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| Title & Author
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Microelectronics failure analysis : : desk reference /\ edited by The Electronic Device Failure Analysis Society, Desk Reference Committee
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| Edition Statement
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5th ed
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| Publication Statement
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Materials Park, Ohio :: ASM International,, c2004
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| Page. NO
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xiv, 800 p. :: ill. ;; 28 cm. ++ 1 CD-ROM (4 3/4 in.)
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| ISBN
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0871708043
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| Notes
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Includes bibliographical references and index
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| Contents
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Introduction -- Failure analysis process flow -- Failure verification -- Failure mode: failure classifications -- Special devices -- Non-destructive analysis techniques -- Depackaging -- Photon emission (electroluminescence) localization techniques -- Microthermography -- Laser and particle beam-based localization techniques -- Deprocessing -- General imaging techniques -- Local deprocessing and imaging -- Materials analysis techniques -- Important topics for semiconductor devices -- FA techniques/tools roadmaps -- FA operation and management -- Appendix
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| Subject
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Microelectronics-- Materials-- Testing, Handbooks, manuals, etc
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| Subject
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Microelectronics-- Defects-- Testing, Handbooks, manuals, etc
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| LC Classification
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TK7874.58.M53 2004
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| Added Entry
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Electronic Device Failure Analysis Society., Desk Reference Committee
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