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" ISTFA 2005 : "
sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2005, ASTM International
Document Type
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BL
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Record Number
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638601
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Doc. No
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dltt
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Main Entry
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International Symposium for Testing and Failure Analysis(31st :2005 :, San Jose, CA.)
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Title & Author
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ISTFA 2005 : : proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California /\ sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2005, ASTM International
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Publication Statement
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Materials Park, Ohio :: ASM International,, c2005
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Page. NO
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xviii, 523 p. :: ill. :; 28 cm. ++ CD-ROM
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ISBN
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087170823X
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Bibliographies/Indexes
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Includes bibliographical references and index
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Subject
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Electronics-- Materials-- Testing, Congresses
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Subject
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Electronic apparatus and appliances-- Testing, Congresses
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Added Entry
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ASM International
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Electronic Device Failure Analysis Society
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