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" ISTFA 2005 : "


Document Type : BL
Record Number : 638601
Doc. No : dltt
Main Entry : International Symposium for Testing and Failure Analysis(31st :2005 :, San Jose, CA.)
Title & Author : ISTFA 2005 : : proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California /\ sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2005, ASTM International
Publication Statement : Materials Park, Ohio :: ASM International,, c2005
Page. NO : xviii, 523 p. :: ill. :; 28 cm. ++ CD-ROM
ISBN : 087170823X
Bibliographies/Indexes : Includes bibliographical references and index
Subject : Electronics-- Materials-- Testing, Congresses
Subject : Electronic apparatus and appliances-- Testing, Congresses
Added Entry : ASM International
: Electronic Device Failure Analysis Society
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