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" ISTFA 2009 : "
sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International
Document Type
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BL
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Record Number
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646540
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Doc. No
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dltt
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Main Entry
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International Symposium for Testing and Failure Analysis(35th :2009 :, San Jose, Calif.)
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Title & Author
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ISTFA 2009 : : conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA /\ sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International
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Publication Statement
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Materials Park, Ohio :: Asm International,, c2009
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Page. NO
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355 p. :: ill. ;; 28 cm. + 1 CD-ROM (4 3/4 in.)
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ISBN
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1615030085
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: 9781615030088
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Bibliographies/Indexes
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Includes bibliographical references and index
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Subject
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Electronics-- Materials-- Testing, Congresses
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Subject
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Electronic apparatus and appliances-- Testing, Congresses
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Dewey Classification
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621.381
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Added Entry
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ASM International
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Electronic Device Failure Analysis Society
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Parallel Title
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Conference proceedings from the 35th International Symposium for Testing and Failure Analysis
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