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" ISTFA 2009 : "


Document Type : BL
Record Number : 646540
Doc. No : dltt
Main Entry : International Symposium for Testing and Failure Analysis(35th :2009 :, San Jose, Calif.)
Title & Author : ISTFA 2009 : : conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA /\ sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International
Publication Statement : Materials Park, Ohio :: Asm International,, c2009
Page. NO : 355 p. :: ill. ;; 28 cm. + 1 CD-ROM (4 3/4 in.)
ISBN : 1615030085
: : 9781615030088
Bibliographies/Indexes : Includes bibliographical references and index
Subject : Electronics-- Materials-- Testing, Congresses
Subject : Electronic apparatus and appliances-- Testing, Congresses
Dewey Classification : ‭621.381‬
Added Entry : ASM International
: Electronic Device Failure Analysis Society
Parallel Title : Conference proceedings from the 35th International Symposium for Testing and Failure Analysis
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