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" Scanning microscopy for nanotechnology "
edited by Weilie Zhou and Zhong Lin Wang.
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BL
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| Record Number
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655236
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dltt
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| Title & Author
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Scanning microscopy for nanotechnology : techniques and applications /\ edited by Weilie Zhou and Zhong Lin Wang.
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| Publication Statement
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New York ;London :: Springer,, 2007.
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| Page. NO
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xiv, 522 p., [12] p. of plates :: ill. (some col.) ;; 24 cm.
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| ISBN
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9780387333250 (cased)
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: 0387333258 (cased)
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| Bibliographies/Indexes
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Includes bibliographical references and index.
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| Contents
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Fundamentals of scanning electron microscopy / Weilie Zhou ... [et al.] -- Backscattering detector and EBSD in nanomaterials characterization / Tim Maitland and Scott Sitzman -- X-ray microanalysis in nanomaterials / Robert Anderhalt -- Low kW scanning electron microscopy / M. David Frey -- E-beam nanolithography integrated with scanning electron microscope / Joe Nabity ... [et al.] -- Scanning transmission electron microscopy for nanostructure characterization / S.J. Pennycook ... [et al.] -- Introduction to in-situ nanomanipulation for nanomaterials engineering / Rishi Gupta and Richard E. Stallcup, II -- Applications of FIB and DualBeam for nanofabrication / Brandon Van Leer, Lucille A. Giannuzzi, and Paul Anzalone -- Nanowires and carbon nanotubes / Jianye Li and Jie Liu -- Photonic crystals and devices / Xudong Wang and Zhong Lin Wang -- Nanoparticles and colloidal self-assembly / Gabriel Caruntu, Daniela Caruntu, and Charles J. O'Connor -- Nano-building blocks fabricated through templates / Feng Li and John B. Wiley -- One-dimensional wurtzite semiconducting nanostructures / Pu Xian Gao and Zhong Lin Wang -- Bio-inspired nanomaterials / Peng Wang ... [et al.] -- Cryo-temperature stages in nanostructural research / Robert P. Apkarian.
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| Subject
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Scanning electron microscopy.
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| Subject
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Nanotechnology.
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| Added Entry
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Zhou, Weili.
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Wang, Zhong Lin.
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