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BL
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| Record Number
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658015
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dltt
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| Main Entry
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Mahoney, Christine M.,1975-
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| Title & Author
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Cluster secondary ion mass spectrometry : : principles and applications /\ edited by Christine M. Mahoney.
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| Series Statement
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Wiley series on mass spectrometry
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| Page. NO
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1 online resource (350 pages).
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| ISBN
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9781118589335 (electronic bk.)
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: 1118589335 (electronic bk.)
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: 9781118589250 (electronic bk.)
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: 1118589254 (electronic bk.)
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1118589254
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9780470886052
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| Abstract
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This book describes the importance of the emerging technique Cluster Secondary Ion Mass Spectrometry (SIMS), which is used for the analysis of a range of solid materials, including everything from organic and polymeric materials, to cells and semiconductors. The text covers a wide range of topics, encompassing fundamentals, theory, and applications including cluster sources, organic and polymeric depth profiling, and 3-D imaging in organic and polymeric materials. Written by founders in the field, this guide creates a peerless compendium of knowledge on this cutting edge set of methods
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| Subject
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Secondary electron emission.
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Secondary ion mass spectrometry.
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Surfaces (Physics)
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| Subject
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Secondary ion mass spectrometry.
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| Dewey Classification
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543.65
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| LC Classification
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QD96.S43 .M34 2013
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| Added Entry
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Ohio Library and Information Network.
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Wiley Online Library (Online service)
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