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Front Matter -- Thematic Area I: Introduction. Reliability of Lead-Free Electronic Solder Interconnects: Roles of Material and Service Parameters / K N Subramanian -- Thematic Area II: Phase Diagrams and Alloying Concepts. Phase Diagrams and Their Applications in Pb-Free Soldering / Sinn-Wen Chen, Wojciech Gierlotka, Hsin-Jay Wu, Shih-Kang Lin -- Phase Diagrams and Alloy Development / Alan Dinsdale, Andy Watson, Ales Kroupa, Jan Vrestal, Adela Zemanova, Pavel Broz -- Interaction of Sn-Based Solders with Ni(P) Substrates: Phase Equilibria and Thermochemistry / Clemens Schmetterer, Rajesh Ganesan, Herbert Ipser -- Thematic Area III: Microalloying to Improve Reliability. 1Effects of Minor Alloying Additions on the Properties and Reliability of Pb-Free Solders and Joints2 / Sung K Kang -- Development and Characterization of Nano-Composite Solder / Johan Liu, Si Chen, Lilei Ye -- Thematic Area IV: Chemical Issues Affecting Reliability. Chemical Changes for Lead-Free Soldering and Their Effect on Reliability / Laura J Turbini -- Thematic Area V: Mechanical Issues Affecting Reliability. Influence of Microstructure on Creep and High Strain Rate Fracture of Sn-Ag-Based Solder Joints / P Kumar, Z Huang, I Dutta, G Subbarayan, R Mahajan -- Microstructure and Thermomechanical Behavior Pb-Free Solders / D R Frear -- Electromechanical Coupling in Sn-Rich Solder Interconnects / Q S Zhu, H Y Liu, L Zhang, Q L Zeng, Z G Wang, J K Shang -- Effect of Temperature-Dependent Deformation Characteristics on Thermomechanical Fatigue Reliability of Eutectic Sn-Ag Solder Joints / Andre Lee, Deep Choudhuri, K N Subramanian -- Thematic Area VI: Whisker Growth Issues Affecting Reliability. Sn Whiskers: Causes, Mechanisms and Mitigation Strategies / Nitin Jadhav, Eric Chason -- Tin Whiskers / Katsuaki Suganuma -- Thematic Area VII: Electromigration Issues Affecting Reliability. Electromigration Reliability of Pb-Free Solder Joints / Seung-Hyun Chae, Yiwei Wang, Paul S Ho -- Electromigration in Pb-Free Solder Joints in Electronic Packaging / Chih Chen, Shih-Wei Liang, Yuan-Wei Chang, Hsiang-Yao Hsiao, Jung Kyu Han, K N Tu -- Effects of Electromigration on Electronic Solder Joints / Sinn-Wen Chen, Chih-Ming Chen, Chao-Hong Wang, Chia-Ming Hsu -- Thematic Area VIII: Thermomigration Issues Affecting Reliability. Thermomigration in SnPb and Pb-Free Flip-Chip Solder Joints / Tian Tian, K N Tu, Hsiao-Yun Chen, Hsiang-Yao Hsiao, Chih Chen -- Thematic Area IX: Miniaturization Issues Affecting Reliability. Influence of Miniaturization on Mechanical Reliability of Lead-Free Solder Interconnects / Golta Khatibi, Herbert Ipser, Martin Lederer, Brigitte Weiss -- Index
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