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" ISTFA 2007 : "
sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2007, ASM International
Document Type
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BL
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Record Number
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660749
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Doc. No
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dltt
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Main Entry
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International Symposium for Testing and Failure Analysis(33rd :2007 :, San Jose, Calif.)
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Title & Author
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ISTFA 2007 : : proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA /\ sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2007, ASM International
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Publication Statement
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Materials Park, Ohio :: ASM International,, c2007
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Page. NO
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xvi, 356 p. :: ill. :; 28 cm. ++ 1 CD-ROM
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ISBN
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0871708639
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: 9780871708632
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Bibliographies/Indexes
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Includes bibliographical references and index
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Subject
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Electronics-- Materials-- Testing, Congresses
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Subject
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Electronic apparatus and appliances-- Testing, Congresses
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Added Entry
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ASM International
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Electronic Device Failure Analysis Society
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Parallel Title
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Proceedings of the 33rd International Symposium for Testing and Failure Analysis
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: 33rd International Symposium for Testing and Failure Analysis
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: Thirty-third International Symposium for Testing and Failure Analysis
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