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" ISTFA 2007 : "


Document Type : BL
Record Number : 660749
Doc. No : dltt
Main Entry : International Symposium for Testing and Failure Analysis(33rd :2007 :, San Jose, Calif.)
Title & Author : ISTFA 2007 : : proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA /\ sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2007, ASM International
Publication Statement : Materials Park, Ohio :: ASM International,, c2007
Page. NO : xvi, 356 p. :: ill. :; 28 cm. ++ 1 CD-ROM
ISBN : 0871708639
: : 9780871708632
Bibliographies/Indexes : Includes bibliographical references and index
Subject : Electronics-- Materials-- Testing, Congresses
Subject : Electronic apparatus and appliances-- Testing, Congresses
Added Entry : ASM International
: Electronic Device Failure Analysis Society
Parallel Title : Proceedings of the 33rd International Symposium for Testing and Failure Analysis
: : 33rd International Symposium for Testing and Failure Analysis
: : Thirty-third International Symposium for Testing and Failure Analysis
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