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" Next generation HALT and HASS : "


Document Type : BL
Record Number : 662063
Doc. No : dltt
Main Entry : Gray, Kirk
Title & Author : Next generation HALT and HASS : : robust design of electronics and systems /\ by Kirk Gray, John James Paschkewitz
Page. NO : 1 online resource
ISBN : 9781118700228
: : 1118700228
: : 9781118700211
: : 111870021X
: 9781118700204
: 1118700201
: 9781118700235 (cloth)
Bibliographies/Indexes : Includes bibliographical references and index
Contents : Basis and limitations of typical current reliability methods & metrics -- The need for reliability assurance metrics to change -- Challenges to advancing electronics reliability engineering -- A new deterministic reliability development paradigm -- Common understanding of HALT approach is critical for success -- The fundamentals of HALT -- Highly accelerated stress screening (HALT) and audits (HASA) -- HALT benefits for software/firmware performance and reliability -- Quantitative accelerated life test -- Failure analysis and corrective action -- Additional applications of HALT methods
Subject : Accelerated life testing.
Subject : Electronic systems-- Design and construction.
Subject : Electronic systems-- Testing.
Dewey Classification : ‭621.381028/7‬
LC Classification : ‭TA169.3‬
Added Entry : Paschkewitz, John James
Added Entry : Ohio Library and Information Network.
copyhttps://lib.clisel.com/site/catalogue/662063
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