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" Frontiers in statistical quality control "
edited by H.-J. Lenz, G.B. Wetherill, and P.-Th. Wilrich.
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BL
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| Record Number
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730686
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b550452
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| Main Entry
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edited by H.-J. Lenz, G.B. Wetherill, and P.-Th. Wilrich.
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| Title & Author
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Frontiers in statistical quality control\ edited by H.-J. Lenz, G.B. Wetherill, and P.-Th. Wilrich.
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| Publication Statement
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Würzburg: Physica-Verlag, 1981
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| Page. NO
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(294 pages) : illustrations
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| ISBN
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3790816876
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: 9783790816877
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| Contents
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Cover --;Contents --;PART 1: GENERAL ASPECTS OF SQC METHODOLOGY --;How Some IS0 Standards Complicate Quality Improvement --;PART 2: ON-LINE CONTROL --;2.1 Sampling Plans --;Optimal Two-Stage Sequential Sampling Plans by Attributes --;Three-Class Sampling Plans: A Review with Applications --;2.2 Control Charts --;CUSUM Control Schemes for Multivariate Time Series --;The Art of Evaluating Monitoring Schemes --;How to Measure the Performance of Control Charts --;Misleading Signals in Joint Schemes for μ and σ --;The Frechet Control Charts --;Reconsidering Control Charts in Japan --;Control Charts for the Number of Children Injured in Traffic Accidents --;A New Perspective on the Fundamental Concept of Rational Subgroups --;Economic Advantages of CUSUM Control Charts for Variables --;Choice of Control Interval for Controlling Assembly Processes --;Generalization of the Run Rules for the Shewhart Control Charts --;2.3 Monitoring --;Robust On-Line Turning Point Detection. The Influence of Turning Point Characteristics --;Specification Setting for Drugs in the Pharmaceutical Industry --;Monitoring a Sequencing Batch Reactor for the Treatment of Wastewater by a Combination of Multivariate Statistical Process Control and a Classification Technique --;PART 3: OFF-LINE CONTROL --;Data Mining and Statistical Control --;A Review and Some Links --;Optimal Process Calibration under Nonsymmetric Loss Function --;The Probability of the Occurrence of Negative Estimates in the Variance Components Estimation by Nested Precision Experiments --;Statistical Methods Applied to a Semiconductor Manufacturing Process --;An Overview of Composite Designs Run as Split-Plots --;Last Page.
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| Subject
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Qualité -- Contrôle.
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Quality control -- Statistical methods.
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Sampling (Statistics)
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| Added Entry
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G Barrie Wetherill
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Hans-Joachim Lenz
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P -Th Wilrich
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