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" Atomic force microscopy/scanning tunneling microscopy 3 "
edited by Samuel H. Cohen and Marcia L. Lightbody.
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BL
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| Record Number
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733244
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b553040
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| Main Entry
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edited by Samuel H. Cohen and Marcia L. Lightbody.
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| Title & Author
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Atomic force microscopy/scanning tunneling microscopy 3\ edited by Samuel H. Cohen and Marcia L. Lightbody.
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| Publication Statement
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New York: Kluwer Academic Publishers, 2002
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| ISBN
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0306462974
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: 0306470950
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: 9780306462979
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: 9780306470950
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| Contents
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Preface. Keynote Paper: A Practical Approach to Understanding Surface Metrology and Its Applications; C.A. Brown. Applications of Scanning Probe Microscopy in Materials Science: Examples of Surface Modification and Quantitative Analysis; P. von Blanckenhagen. Scanning Probe Microscopy in Biology with Potential Applications in Forensics; J. Vesenka, E. Morales. Atomic Manipulation of Hydrogen on Hydrogen-Terminated Silicon Surfaces with Scanning Tunneling Microscope; D.H. Huang, Y. Yamamoto. Apollo 11 Lunar Samples: An Examination Using Tapping Mode Atomic Force Microscopy and Other Microscopic Methods; E.C. Hammond, et al. Novel Micromachined Cantilever Sensors for Scanning Near-Field Microscopy; W. Scholz, et al. Imaging of Cell Surface Structure by Scanning Probe Microscopy; V.A. Fedirko, et al. A Force Limitation for Successful Observation of Atomic Defects: Defect Trapping of the Atomic Force Microscopy Tip; I.Y. Sokolov, et al. A New Approach To Examine Interfacial Interaction Potential Between a Thin Solid Film or a Droplet and a Smooth Substrate; R. Mu, et al. Nanometer-Scale Patterning of Surfaces Using Self-Assembly Chemistry. 1. Preliminary Studies of Polyaniline Electrodeposition on Self-Assembled Mixed Monolayers; W.A. Hayes, C. Shannon. Local Rate of Electroless Copper Deposition by Scanning Tunneling Microscopy; C.J. Weber, et al. Atomic Force Microscopy of Olivine; C. Wilson, et al. The Study of Sublimation Rates and Nucleation and Growth of TNT and PETN on Silica and Graphite Surfaces by Optical and Atomic Force Microscopy and Ellipsometry; Y.S. Tung, et al. Peculiarities of the Scanning Tunneling Microscopy Probe on Porous Gallium Phosphide; V.M. Ichizli, et al. Influence of Doping Concentration on The Etching Rate of GaAs Studied by Atomic Force Microscopy; R.S. Freitas, et al.Comparative Scanning Tunneling Microscopy Studies of CoFe2O4 Nanoparticles of Ferrofluids in Acidic Medium; D. Dai, et al. From Laboratory Measurements to the First In-Situ Analysis of Pristine Cometary Grains; J. Romstedt, et al. Synthesis of Prebiotic Peptides and Oligonucleotides on Clay Mineral Surfaces: A Scanning Force Microscopy Study; T.L. Porter, et al. Surface Structure and Intercalative Polymerization Studies of Smectite Clay Thin Films; T.L. Porter, et al. Atomic Force Microscopy A New and Complementary Tool in Asphalt Research Compared to Scanning Electron Microscopy; L. Loeber, et al. Index.
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| Subject
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Microscòpia d'escombratge per efecte túnel.
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| Subject
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Microscòpia electrònica de rastreig.
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Microscòpia electrònica d'escombratge.
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| LC Classification
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QH212.A78E358 2002
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| Added Entry
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Marcia L Lightbody
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Samuel H Cohen
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