رکورد قبلیرکورد بعدی

" Practical stereology. "


Document Type : BL
Record Number : 738986
Doc. No : b558899
Main Entry : John C Russ
Title & Author : Practical stereology.\ John C Russ
Publication Statement : [Place of publication not identified]: Springer, 2013
ISBN : 1461512336
: : 1489935339
: : 9781461512332
: : 9781489935335
Contents : 1: Introduction.- Elements of microstucture.- Geometric properties of features.- Typical stereological procedures.- Fundamental relationships.- Intercept length and grain size.- Curvature.- Second order stereology.- Stereology of single objects.- 2: Basic Stereological Procedures.- What stereology is.- How stereology works.- Why stereology works.- Ground rules for applying stereology.- 3: Geometry of Microstructures.- The qualitative microstructural state.- The quantitative microstructural state.- Metric properties.- Topological properties.- Ratios of global properties.- The topographic microstructural state.- Gradients: variation with position.- Anisoptropies: variation with orientation.- Associations.- 4: Classical Stereological Measures.- Two-dimensional structures; area fraction from the point count.- Volume fraction from the point count.- Two-dimensional structures; feature perimeter from the line intercept count.- Three-dimensional structures: surface area and the line intercept count.- Three-dimensional microstructures; line length and the area point count.- 5: Less Common Stereological Measures.- Three-dimensional features: topological properties and the volume tangent count.- Three-dimensional features: the mean caliper diameter.- Mean surface curvature and its integral.- The sweeping line probe in two dimensions.- Edges in three-dimensional Microstructures.- 6: Sample Design in Stereology.- Population of point probes.- Population of lines in two dimensions.- Line probes in three dimensions.- Planes in three-dimensional space.- Disectors in three-dimensional space.- Sampling strategies in 3D.- 7: Procedures for IUR Sampling.- Volume fraction.- Sampling planes.- Isotropic planes.- Isotropic line probes.- Volume probes-the Disector.- Networks.- 8: Statistical Interpretation of Data.- Sources of variability in measurement.- Distributions of values.- The mean, median and mode.- The central limit theorem and the Gaussian distribution.- Variance and standard deviation.- Testing distributions for normality-skew and kurtosis.- Some other common distributions.- Comparing sets of measurements-the T-test.- Nonparametric comparisons.- Linear regression.- Nonlinear regression.- 9: Computer-Assisted Methods.- Getting the image to the computer.- Display and storage.- Image processing.- Contrast manipulation.- Correcting nonuniform brightness.- Reducing image noise.- Rectifying image distortion.- Enhancement.- Overlaying grids onto images.- Basic stereological calculations.- 10: Computer Measurement of Images.- Measurement using grids.- Measuring area with pixels.- Measurement parameters-size.- Other feature measurements: shape and position.- Image processing to enable thresholding and measurement.- Image processing to extract measurable information.- Combining multiple images.- 11: Geometric Modeling.- Methods: analytic and sampling.- Sphere intercepts.- Intercept lengths in other bodies.- Intercept lengths in three dimensions.- Intersections of planes with objects.- Bertrand's paradox.- The Buffon needle problem.- 12: Unfolding Size Distributions.- Linear intercepts in spheres.- Plane intersections.- Other shapes.- Simpler methods.- Lamellae.- 13: Anisotropy and Gradients.- Grain structures in rolled metals.- Boundary orientation.- Gradients and neighbor relationships.- Distances and irregular gradients.- Alignment.- 14: Finite Section Thickness.- Projected images.- Bias in stereological measurements.- Measurements within sections.- 15: Three-Dimensional Imaging.- Limitations of stereology.- Serial methods for acquiring 3D image data.- Inversion to obtain 3D data.- Stereoscopy as a 3D technique.- Visualization.- Processing.- Measurement.- References.
LC Classification : ‭Q175‬‭.J646 2013‬
Added Entry : John C Russ
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