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" X-Ray Diffraction by Disordered Lamellar Structures : "


Document Type : BL
Record Number : 753365
Doc. No : b573326
Main Entry : by Victor A. Drits, Cyril Tchoubar.
Title & Author : X-Ray Diffraction by Disordered Lamellar Structures : : Theory and Applications to Microdivided Silicates and Carbons\ by Victor A. Drits, Cyril Tchoubar.
Publication Statement : Berlin, Heidelberg : Springer Berlin Heidelberg, 1990
Page. NO : (XVII, 371 Seiten)
ISBN : 3642748023
: : 9783642748028
Abstract : New methods for the determination of the nature, proportion, and distribution of structural defects in microcrystallized lamellar systems are of utmost importance not only to experimentalists but also to theoreticians. Mathematical formalism - indispensable for such analyses - is well-illustrated by various examples, allowing this method to be easily adopted and even to be applied to other solids with lamellar or pseudo-lamellar structures.
Subject : Crystallography.
Subject : Earth Sciences.
Subject : Mineralogy.
LC Classification : ‭QD945‬‭.B985 1990‬
Added Entry : Cyril Tchoubar
: Victor A Drits
copyhttps://lib.clisel.com/site/catalogue/753365
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