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" Secondary ion mass spectrometry : "


Document Type : BL
Record Number : 754374
Doc. No : b574336
Main Entry : editors, A. Benninghoven [and others].
Title & Author : Secondary ion mass spectrometry : : SIMS V : proceedings of the fifth international conference, Washington, DC, September 30-October 4, 1985\ editors, A. Benninghoven [and others].
Publication Statement : Berlin ; New York : Springer-Verlag, ©1986.
Series Statement : Springer series in chemical physics, 44.
Page. NO : (xxi, 561 pages) : illustrations
ISBN : 3642827241
: : 9783642827242
Contents : I Retrospective --; II Fundamentals --; III Symposium: Detection of Sputtered Neutrals --; IV Detection Limits and Quantification --; V Instrumentation --; VI Techniques Closely Related to SIMS --; VII Combined Techniques and Surface Studies --; VIII Ion Microscopy and Image Analysis --; IX Depth Profiling and Semiconductor Applications --; X Metallurgical Applications --; XI Biological Applications --; XII Geological Applications --; XIII Symposium: Particle-Induced Emission from Organics --; XIV Organic Applications Including Fast Atom Bombardment Mass Spectrometry --; Index of Contributors.
Subject : Secondary ion mass spectrometry -- Congresses.
Subject : Secondary ion mass spectrometry.
LC Classification : ‭QD96.S43‬‭E358 1986‬
Added Entry : A Benninghoven
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