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" Laser in der Technik / Vorträge des 10. Internationalen Kongresses / Proceedings of the 10th International Congress: "
Laser in Engineering :
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Latin Dissertation
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| Language of Document
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English
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| Record Number
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1113221
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| Doc. No
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TLpq230778141
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| Main Entry
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M. Ashtijou
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S. Lu
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| Title & Author
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A parallel testing algorithm for pattern sensitive faults in random access memory\ S. LuM. Ashtijou
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| College
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Texas A&M University - Kingsville
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| Date
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1994
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| student score
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1994
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| Degree
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M.S.
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| Page No
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154
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| Abstract
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A pattern sensitive fault recognition algorithm (PSFRA) is presented that not only detects and locates the neighborhood pattern sensitive faults (NPSF) but also it recognizes the types of the fault. A parallel testing structure for NPSF in Random Access Memory (RAM) has been developed in (1) to reduce overall test time and cost. It is designed for a broad class of pattern-sensitive faults and is significantly more efficient than previous approaches. The algorithm is modified to provide a fault type recognition capability that helps in differentiating between active, passive, and static NPSF for Type-1 and Type-2 neighborhood. The PSFRA needs 321 N write operations and 480 N read operations for Type-1 neighborhood, and it needs 129 N write operations and 192 N read operations for Type-2 neighborhood (N is the memory size). The recognition of fault is in expense of more test time and it is still more efficient than sequential algorithms.
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| Subject
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Applied sciences
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Computer science
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Electrical engineering
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