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BL
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| Record Number
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754644
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b574606
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| Main Entry
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edited by Rainer Kassing.
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| Title & Author
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Scanning Microscopy : : Symposium Proceedings\ edited by Rainer Kassing.
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| Publication Statement
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Berlin, Heidelberg : Springer Berlin Heidelberg, 1992
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| Series Statement
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ESPRIT basic research series.
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| Page. NO
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(x, 207 pages 132 illustrations)
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| ISBN
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3642848109
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: 9783642848100
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| Contents
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Performance and Selection Criteria of Critical Components of STM and AFM --; Investigations on the SFM --; Tip to Substrate Interaction --; New Scanning Microscopy Techniques: Scanning Noise Microscopy --; Scanning Tunneling Microscopy Assisted by Surface Plasmons --; An STM Study of the Oxygenation of Silicon --; Scanning Near Field Optical Microscopy --; Study of Epitaxial Growth by Combination of STM and LEED --; STM Studies of Adsorbates in the Monolayer Range: Ag/Ni(100) and O/Ni(100) --; Molecular Imaging with the Scanning Tunneling Microscope --; Imaging of Magnetic Domains in Ferromagnets and Superconductors by Force and Tunneling Microscopy --; Acoustic Microscopy: Pictures to Ponder --; Real-Time Confocal Scanning Microscope --; An Optical Instrument with a Better Depth Resolution --; On the Search for Last Frontiers --Scanning Tunneling Microscopy and Related Techniques (Abstract) --; STM and AFM Extensions (Abstract).
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| Abstract
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With the award of a Nobel Prize in 1986 to Binnig and Rohrer for their invention of the scanning tunneling microscope, the field of scanning microscopy was given a strong boost. Microscopic techniques are used not only for research work in material and life science but also for routine applications in almost all vital sectors of everyday life. The demand for better understanding of materials and of all aspects of human life initiated an ongoing development of improved microscopic techniques. Inparticular, expanding the capability to access nature's foundations at the atomic level is now recognized as having the potential for major impact in information technology. This volume presents the proceedings of the IMO Symposium Fall '90, which brought together leading scientists in scanning microscopy from research institutes and industry, each of whom was invited to contribute a lecture. The lectures on the techniques of scanning microscopy and of current applications, including results of recentESPRIT basic research actions, provide a complete overview of the state of the art.
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| Subject
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Cytology.
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Electronics.
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Engineering.
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| LC Classification
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QH212.S35E358 1992
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| Added Entry
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R Kassing
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