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" Ultimate Limits of Fabrication and Measurement "
edited by M.E. Welland, J.K. Gimzewski.
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BL
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| Record Number
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774582
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b594577
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| Main Entry
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edited by M.E. Welland, J.K. Gimzewski.
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| Title & Author
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Ultimate Limits of Fabrication and Measurement\ edited by M.E. Welland, J.K. Gimzewski.
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| Publication Statement
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Dordrecht : Springer Netherlands : Imprint : Springer, 1995
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| Series Statement
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NATO ASI series., Series E,, Applied sciences ;, 292.
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| Page. NO
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(268 pages 28 illustrations)
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| ISBN
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9401040230
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: 9401100411
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: 9789401040235
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: 9789401100410
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| Contents
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Towards Molecular and Supramolecular Devices --; Nanoscale Fabrication --; Microminiaturization in Laser Surgery and in vivo Intradiscal Pressure Measurement in Intervertebral Discs --; Self Replicating Systems and Low Cost Manufacturing --; The Use of Actuation Principles for Micro Robots --; Biophysical Approach to Nano-Mental Engineering's Limits --; IDEAS --; Intelligent Design Environment for Algorithms and Systems --; Electron-Nucleus Interaction in a Finite Atomic Line Modulated by a Focussed Electric Field --; Electromagnetic Radiation in Nanostructures --; Using Atom Optics to Fabricate Nanostructures --; Limits to Squeezing of Quantum Fluctuations --; Micromechanical Calorimeter with Picojoule-Sensitivity --; The Point-Contact Thermometer and Its Application in the Study of Hydrodynamic Electron Flow --; Noise in Scanning Tunneling Microscopy --; A Nanosensor for Admittance Spectroscopy --; Nanodeformation --; Solid or Liquid? --; Theory of Conduction through Quantum Necks --; A Scanning Force and Friction Microscope --; Electrical Properties of Nanometer-Size Metal-Semiconductor Point Contacts --; Study of Contact in the Fabrication of Gold Nanostructures by Scanning Tunneling Microscopy --; Fabrication of Nanoscale Gold Contacts with the STM: Possible Applications --; Suppression of Electron Tunneling through Liquid Crystal Molecules due to Infrared Irradiation --; Influence of Thickness Fluctuations on Exchange Coupling in Fe/Cr/Fe Structures --; l?3 Dimensional Structures on a Uni-Directional Substrate --; S-Layers as Molecular Patterning Structures --; Formation of Sub-Micrometer Structures in Soft Functionalized Langmuir-Blodgett Films by Atomic Force Microscopy --; Individual Molecules on GaAs(001)-(2×4) and Si(001)-(2×1): Images, Statistics, and odelling --; Extended Abstracts of Invited Papers --; Molecular Manufacturing --; Self-Assembly: Whither and Thither Molecular Machines --; Nanostructured Sensors for Molecular Recognition --; Micromechanisms --; Limits to Mechanical Positioning and Displacement --; Is Quantum Mechanics Useful? --; The Limit of Resistance --; Nanocrystals and Nano-Optics.
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| Abstract
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An extensive body of research is involved in pushing miniaturisation to its physical limit, encompassing the miniaturisation of electronic devices, the manipulation of single atoms by scanning tunnelling microscopy, bio-engineering, the chemical synthesis of complex molecules, microsensor technology, and information storage and retrieval. In parallel to these practical aspects of miniaturisation there is also the necessity to understand the physics of small structures. <br/> Ultimate Limits of Fabrication and Measurement brings together a number of leading articles from a variety of fields with the common aim of ultimate miniaturisation and measurement. <br/>
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| Subject
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Manufacturing processes -- Congresses.
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Measurement -- Congresses.
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Nanotechnology -- Congresses.
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| LC Classification
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T174.7E358 1995
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| Added Entry
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J K Gimzewski
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M E Welland
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| Parallel Title
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Proceedings of the NATO Advanced Research Workshop, Cambridge, U.K., April 1--3, 1994
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