|
" Scanning electron microscopy and x-ray microanalysis / "
Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy.
| Document Type
|
:
|
BL
|
| Record Number
|
:
|
809745
|
| Doc. No
|
:
|
b623761
|
| Title & Author
|
:
|
Scanning electron microscopy and x-ray microanalysis /\ Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy.
|
| Edition Statement
|
:
|
Fourth edition.
|
| Publication Statement
|
:
|
New York, NY :: Springer,, ©2018.
|
| Page. NO
|
:
|
xxiii, 550 pages :: illustrations (some color) ;; 29 cm
|
| ISBN
|
:
|
149396674X
|
|
|
:
|
: 9781493966745
|
|
|
:
|
9781493966769
|
| Bibliographies/Indexes
|
:
|
Includes bibliographical references and index.
|
| Contents
|
:
|
Preface -- Scanning Electron Microscopy and Associated Techniques: Overview -- Electron Beam - Specimen Interactions: Interaction Volume -- Backscattered Electrons -- Secondary Electrons -- X-rays -- SEM Instrumentation -- Image Formation -- SEM Image Interpretation -- The Visibility of Features in SEM Images -- Image Defects -- High resolution imaging -- Low Beam Energy SEM -- Variable Pressure Scanning Electron Microscopy (VPSEM) -- ImageJ and Fiji -- SEM Imaging checklist -- SEM Case Studies -- Energy Dispersive X-ray Spectrometry: Physical Principles and User-Selected Parameters -- DTSA-II EDS Software -- Qualitative Elemental Analysis by Energy Dispersive X-ray Spectrometry -- Quantitative Analysis: from k-ratio to Composition -- Quantitative analysis: the SEM/EDS elemental microanalysis k-ratio procedure for bulk specimens, step-by-step -- Trace Analysis by SEM/EDS -- Low Beam Energy X-ray Microanalysis -- Analysis of Specimens with Special Geometry: Irregular Bulk Objects and Particles -- Compositional Mapping -- Attempting Electron-Excited X-ray Microanalysis in the Variable Pressure Scanning Electron Microscope (VP-SEM) -- Energy Dispersive X-ray Microanalysis Checklist -- X-ray Microanalysis Case Studies -- Cathodoluminescence -- Characterizing crystalline materials in the SEM -- Focused Ion Beam Applications in the SEM laboratory -- Ion Beam Microscopy -- Appendix - A Database of Electron-Solid Interactions -- Index.
|
| Subject
|
:
|
Scanning electron microscopy.
|
| Subject
|
:
|
Microscopy, Electron, Scanning.
|
| Subject
|
:
|
Scanning electron microscopy.
|
| Subject
|
:
|
Science.
|
| Dewey Classification
|
:
|
502.825
|
| Added Entry
|
:
|
Goldstein, Joseph,1939-
|
|
|
:
|
Newbury, Dale E.
|
|
|
:
|
Michael, Joseph R.
|
|
|
:
|
Ritchie, Nicholas W. M.
|
|
|
:
|
Scott, John Henry J.
|
|
|
:
|
Joy, David C.,1943-
|
| |