Scanning Electron Microscopy and X-Ray Microanalysis /

" Scanning Electron Microscopy and X-Ray Microanalysis / "
by Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy.

Document Type	:	BL
Record Number	:	809746
Doc. No	:	b623762
Main Entry	:	Goldstein, Joseph I.
Title & Author	:	Scanning Electron Microscopy and X-Ray Microanalysis /\ by Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy.
Edition Statement	:	4th ed. 2018.
Page. NO	:	1 Online-Ressource (XXIII, 550 p. 546 illus., 409 illus. in color)
ISBN	:	9781493966769
	:	: 1493966766
Subject	:	Materials science.
Subject	:	Spectroscopy.
Subject	:	Microscopy.
Subject	:	Physical measurements.
Subject	:	Measurement.
Subject	:	Materials Science.
Subject	:	Characterization and Evaluation of Materials.
Subject	:	Spectroscopy and Microscopy.
Subject	:	Biological Microscopy.
Subject	:	Spectroscopy/Spectrometry.
Subject	:	Measurement Science and Instrumentation.
Subject	:	Materials science.
Subject	:	Spectrum analysis.
Subject	:	Microscopy.
Subject	:	Physical measurements.
Subject	:	Measurement.
Subject	:	Materials science.
Subject	:	Measurement.
Subject	:	Microscopy.
Subject	:	Physical measurements.
Subject	:	Spectrum analysis.
Dewey Classification	:	‭620.11‬
LC Classification	:	‭TA404.6‬
Added Entry	:	Newbury, Dale E.
	:	Michael, Joseph R.
	:	Ritchie, Nicholas W.M.
	:	Scott, John Henry J.
	:	Joy, David C.

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