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BL
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| Record Number
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840212
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| Main Entry
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He, Bob B.,1954-
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| Title & Author
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Two-dimensional x-ray diffraction /\ Bob Baoping He.
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| Edition Statement
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Second edition.
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| Publication Statement
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Hoboken, NJ :: John Wiley & Sons, Inc.,, 2018.
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, ©2018
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| Page. NO
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1 online resource (xv, 472 pages)
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| ISBN
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1119356067
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: 1119356083
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: 1119356091
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: 9781119356066
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: 9781119356080
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: 9781119356097
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9781119356103
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| Bibliographies/Indexes
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Includes bibliographical references and index.
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| Contents
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Cover; Title Page; Copyright; Contents; Preface; Chapter 1 Introduction; 1.1 X-Ray Technology, a Brief History; 1.2 Geometry of Crystals; 1.2.1 Crystal Lattice and Symmetry; 1.2.2 Lattice Directions and Planes; 1.2.3 Atomic Arrangement in Crystal Structures; 1.2.4 Imperfections in Crystal Structure; 1.3 Principles of X-Ray Diffraction; 1.3.1 Bragg's Law; 1.3.2 Diffraction Patterns; 1.4 Reciprocal Space and Diffraction; 1.4.1 Reciprocal Lattice; 1.4.2 The Ewald Sphere; 1.4.3 Diffraction Cone and Diffraction Vector Cone; 1.5 Two-Dimensional X-Ray Diffraction.
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1.5.1 Diffraction Pattern Measured by Area Detector1.5.2 Materials Characterization with 2D Diffraction Pattern; 1.5.3 Two-Dimensional X-Ray Diffraction System and Major Components; 1.5.4 Summary; References; Chapter 2 Geometry and Fundamentals; 2.1 Introduction; 2.1.1 Comparison Between XRD2 and Conventional XRD; 2.2 Diffraction Space and Laboratory Coordinates; 2.2.1 Diffraction Cones in Laboratory Coordinates; 2.2.2 Diffraction Vector Cones in Laboratory Coordinates; 2.3 Detector Space and Detector Geometry; 2.3.1 Ideal Detector for Diffraction Pattern in 3D Space.
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2.3.2 Diffraction Cones and Conic Sections with Flat 2D Detectors2.3.3 Detector Position in the Laboratory System; 2.3.4 Pixel Position in Diffraction Space -- Flat Detector; 2.3.5 Pixel Position in Diffraction Space -- Flat Detector Out of Diffractometer Plane; 2.3.6 Pixel Position in Diffraction Space -- Cylindrical Detector; 2.4 Sample Space and Goniometer Geometry; 2.4.1 Sample Rotations and Translations in Eulerian Geometry; 2.4.2 Variation of Goniometer Geometry; 2.5 Transformation from Diffraction Space to Sample Space; 2.6 Reciprocal Space; 2.7 Summary; References.
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Chapter 3 X-Ray Source and Optics3.1 X-Ray Generation and Characteristics; 3.1.1 X-Ray Spectrum and Characteristic Lines; 3.1.2 Focal Spot and Takeoff Angle; 3.1.3 Focal Spot Brightness and Profile; 3.1.4 Absorption and Fluorescence; 3.1.5 Synchrotron Radiation; 3.2 X-Ray Optics; 3.2.1 Liouville's Theorem and Fundamentals; 3.2.2 X-Ray Optics in Conventional Diffractometer; 3.2.3 X-Ray Optics in a Two-Dimensional Diffractometer; 3.2.4 The -Filter; 3.2.5 Crystal Monochromator; 3.2.6 Multilayer Mirrors; 3.2.7 Pinhole Collimator; 3.2.8 Capillary Optics; References.
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Chapter 4 X-Ray Detectors4.1 History of X-Ray Detection Technology; 4.2 Point Detectors in Conventional Diffractometers; 4.2.1 Proportional Counters; 4.2.2 Scintillation Counters; 4.2.3 Solid State Detectors; 4.3 Characteristics of Point Detectors; 4.3.1 Counting Statistics; 4.3.2 Detective Quantum Efficiency and Energy Range; 4.3.3 Detector Linearity and Maximum Count Rate; 4.3.4 Energy Resolution; 4.3.5 Detection Limit and Dynamic Range; 4.4 Line Detectors; 4.4.1 Geometry of Line Detectors; 4.4.2 Types of Line Detectors; 4.4.3 Characteristics of Line Detectors.
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| Subject
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X-rays-- Diffraction-- Experiments.
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X-rays-- Diffraction-- Industrial applications.
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X-rays-- Diffraction.
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SCIENCE-- Physics-- Crystallography.
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X-rays-- Diffraction-- Experiments.
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X-rays-- Diffraction-- Industrial applications.
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X-rays-- Diffraction.
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| Dewey Classification
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548/.83
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| LC Classification
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QC482.D5H4 2018
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