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" Spectroscopic ellipsometry for photovoltaics. "
Hiroyuki Fujiwara, Robert W. Collins, editors.
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BL
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| Record Number
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864868
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| Title & Author
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Spectroscopic ellipsometry for photovoltaics.\ Hiroyuki Fujiwara, Robert W. Collins, editors.
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| Publication Statement
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Cham, Switzerland :: Springer,, 2018.
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| Series Statement
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Springer series in optical sciences,; volume 212
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| Page. NO
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1 online resource (xx, 594 pages) :: illustrations (some color)
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| ISBN
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3319753754
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: 3319753762
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: 3319753770
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: 9783319753751
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: 9783319753768
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: 9783319753775
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9783319753751
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| Bibliographies/Indexes
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Includes bibliographical references and index.
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| Contents
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Introduction -- Part I: Fundamental Principles of Ellipsometry -- Measurement Technique of Ellipsometry -- Data Analysis -- Optical Properties of Semiconductors -- Dielectric Function Modeling -- Effect of Roughness on Ellipsometry Analysis -- Part II: Characterization of Materials and Structures -- Ex-situ Analysis of Multijunction Solar Cells Based on Hydrogenated Amorphous Silicon -- Crystalline Silicon Solar Cells -- Amorphous/Crystalline Si Heterojunction Solar Cells -- Optical Properties of Cu(In, Ga)Se2 -- Real Time and In-Situ Spectroscopic Ellipsometry of CuyIn1-xGaxSe2 for Complex Dielectric Function Determination and Parameterization -- Cu2ZnSn(S, Se)4 and Related Materials -- Real Time and Mapping Spectroscopic Ellipsometry for CdTe Photovoltaics -- High Efficiency III-V Solar Cells -- Organic Solar Cells -- Organic-Inorganic Hybrid Perovskite Solar Cells -- Solar Cells with Photonic and Plasmonic Structures -- Transparent Conductive Oxide Materials -- High-Mobility Transparent Conductive Oxide Layers.
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| Abstract
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This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community. The book describes optical constants of a variety of semiconductor light absorbers, transparent conductive oxides and metals that are vital for the interpretation of solar cell characteristics and device simulations. It is divided into four parts: fundamental principles of ellipsometry; characterization of solar cell materials/structures; ellipsometry applications including optical simulations of solar cell devices and online monitoring of film processing; and the optical constants of solar cell component layers.
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| Subject
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Ellipsometry.
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Photovoltaic power generation.
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Ellipsometry.
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Photovoltaic power generation.
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| Dewey Classification
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620.1/1295
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| LC Classification
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QC443
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| Added Entry
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Collins, Robert W.
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Fujiwara, Hiroyuki
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| Parallel Title
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Fundamental principles and solar cell characterization
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