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" Kelvin probe force microscopy : "
Sascha Sadewasser, Thilo Glatzel, editors.
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BL
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| Record Number
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864947
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| Title & Author
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Kelvin probe force microscopy : : from single charge detection to device characterization /\ Sascha Sadewasser, Thilo Glatzel, editors.
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| Publication Statement
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Cham, Switzerland :: Springer,, [2018]
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| Series Statement
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Springer Series in Surface Sciences,; 65
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| Page. NO
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1 online resource (XXIV, 521 pages) :: 234 illustrations, 194 illustrations in color
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| ISBN
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3030092984
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: 3319756877
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: 3319756885
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: 9783030092986
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: 9783319756875
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: 9783319756882
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3319756869
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9783319756868
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| Bibliographies/Indexes
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Includes bibliographical references and index.
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| Contents
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Part I: Technical aspects -- Experimental technique and working modes -- Dissipation KPFM -- KPFM techniques for liquid environment -- Open-loop and excitation KPFM -- Quantitative KPFM on semiconductor devices -- KPFM with atomic resolution.- KPFM with atomic resolution -- Part II: Theoretical Aspects -- Local dipoles in atomic and Kelvin probe force microscopy -- Influence of the tip electrostatic field on high resolution KPFM measurements -- Modelling the electrostatic field of a cantilever -- Theory of open-loop KPFM -- KPFM in a SPM simulator -- Electrostatic interactions with dielectric samples -- Part III: Applications -- Kelvin spectroscopy of single molecules -- KPFM for single molecule chemistry -- Optoelectronic properties of single molecules -- Quantitative KPFM of molecular self-assemblies -- Applications of KPFM in liquids -- KPFM of organic solar cell materials -- Correlation of optical and electrical nanoscale properties of organic devices -- KPFM for catalysis -- Quantitative electrical measurements of SiC devices.
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| Abstract
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This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics. In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors' previous volume "Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces," presents new and complementary topics. It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field.
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Atomic force microscopy.
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Electrostatics-- Measurement.
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Scanning probe microscopy.
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Materials science.
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Materials science.
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Measurement.
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Mensuration systems of measurement.
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Microscopy.
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Nanotechnology.
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Physical measurements.
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Physics.
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Precision instruments manufacture.
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SCIENCE-- General.
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Spectrum analysis, spectrochemistry, mass spectrometry.
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Spectrum analysis.
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Surfaces (Technology)
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Testing of materials.
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Thin films.
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| Dewey Classification
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502.8/2
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| LC Classification
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QH212.A78K45 2018
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| Added Entry
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Glatzel, Thilo
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Sadewasser, Sascha
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