Document Type
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BL
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Record Number
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865481
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Main Entry
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Zhuang, Yuming
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Title & Author
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Accurate and robust spectral testing with relaxed instrumentation requirements /\ Yuming Zhuang, Degang Chen.
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Publication Statement
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Cham, Switzerland :: Springer,, 2018.
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Page. NO
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1 online resource
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ISBN
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3030085201
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: 3319777181
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: 331977719X
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: 9783030085209
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: 9783319777184
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: 9783319777191
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3319777173
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9783319777177
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Bibliographies/Indexes
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Includes bibliographical references.
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Contents
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Intro; Abstract; Acknowledgments; Contents; Chapter 1: Introduction; 1.1 Background on Spectral Testing; 1.2 IEEE Standards and Conventional Spectral Testing; 1.3 Conventional Spectral Testing Challenges; References; Chapter 2: Algorithms for Accurate Spectral Analysis in the Presence of Arbitrary Non-coherency and Large Distortion; 2.1 Introduction; 2.2 Problem Statement; 2.3 Algorithms for Resolving Non-coherency with Large Distortion; 2.3.1 Algorithm 1; 2.3.2 Algorithm 2; 2.3.3 Algorithm 3; 2.3.4 Algorithm Analysis; 2.4 Simulation Results; 2.4.1 Functionality; 2.4.2 Robustness.
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2.5 Measurement Results2.6 Conclusion; References; Chapter 3: Accurate Spectral Testing with Arbitrary Non-coherency in Sampling and Simultaneous Drifts in Amplitude and Frequen ... ; 3.1 Introduction; 3.2 Standard Test and Drift Issue; 3.2.1 Standard Test; 3.2.2 Challenges of Amplitude/Frequency Drift and Non-coherent Sampling; 3.3 Proposed Algorithm; 3.3.1 Drift Segmentation; 3.3.2 Drift Modeling; 3.3.3 Signal Segmentation and Drift Estimation; 3.3.4 Error Analysis; 3.3.5 Segment Length Selection; 3.4 Simulation Results; 3.4.1 Functionality; 3.4.2 Robustness: Segment Length.
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3.4.3 Robustness: Number of Periods3.4.4 Robustness: Non-coherency; 3.5 Measurement Results; 3.6 Conclusion; References; Chapter 4: High-Purity Sine Wave Generation Using Nonlinear DAC with Pre-distortion Based on Low-Cost Accurate DAC-ADC Co-test ... ; 4.1 Introduction; 4.2 Challenges of the Standard Test; 4.3 Proposed Method; 4.3.1 ADC Nonlinearity Estimation; 4.3.2 DAC Nonlinearity Estimation; 4.3.3 Pre-distortion; 4.4 Simulation Results; 4.4.1 Functionality; 4.4.2 Robustness; 4.5 Measurement Results; 4.6 Conclusion; References.
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6.2 Non-coherent Sampling for Multi-tone Test6.3 Proposed Method; 6.3.1 Fundamentals Initial Estimation; 6.3.2 More Accurate Estimation of the Fundamentals; 6.3.3 Coherent Spectrum Construction; 6.4 Simulation Results; 6.4.1 Functionality; 6.4.2 Robustness; 6.5 Measurement Results; 6.6 Conclusion; References; Chapter 7: Accurate Spectral Testing with Impure Test Stimulus for Multi-tone Test; 7.1 Introduction; 7.2 Impure Test Stimulus for Multi-tone Test; 7.3 Proposed Method; 7.3.1 Impure Stimulus; 7.3.2 Two Filters; 7.3.3 Proposed Method; 7.3.4 Discussion; 7.4 Simulation Results.
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Chapter 5: Low-Cost Ultrapure Sine Wave Generation with Self-Calibration5.1 Introduction; 5.2 Proposed Method; 5.2.1 Signal Derivation; 5.2.2 Fundamental Amplitude Match; 5.2.3 Fundamental Phase Match; 5.2.4 Non-coherent Fundamental Identification; 5.2.5 DAC Nonlinearity Estimation; 5.2.6 Cal DAC Calibration; 5.2.7 Ultrapure Signal Capturing; 5.2.8 Iterations and Convergence; 5.3 Simulation Results; 5.4 Measurement Results; 5.5 Conclusion; References; Chapter 6: Accurate Spectral Testing with Non-coherent Sampling for Multi-tone Test; 6.1 Introduction.
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Abstract
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This book introduces a family of new methods for accurate and robust spectral testing and fills an information gap, as the requirements in standard test have grown increasingly challenging in recent high precision testing, especially as the device performance has continued to improve. Test engineers will be enabled to accurately set their devices & systems at much simpler test setup, much reduced complexity and much lower cost.
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Subject
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Measuring instruments-- Testing.
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Subject
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Signal theory (Telecommunication)
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Subject
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Circuits components.
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Subject
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Electronics engineering.
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Subject
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Measuring instruments-- Testing.
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Subject
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Signal theory (Telecommunication)
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Subject
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TECHNOLOGY ENGINEERING-- Mechanical.
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Dewey Classification
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621.382/23
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LC Classification
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TK7868.D5
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Added Entry
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Chen, Degang
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