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BL
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| Record Number
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865735
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| Main Entry
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Prinzie, Jeffrey
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| Title & Author
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Radiation hardened CMOS integrated circuits for time-based signal processing /\ Jeffrey Prinzie, Michiel Steyaert, Paul Leroux.
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| Publication Statement
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Cham, Switzerland :: Springer,, 2018.
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| Series Statement
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Analog circuits and signal processing,
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| Page. NO
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1 online resource
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| ISBN
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3319786164
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: 9783319786162
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3319786156
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9783319786155
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| Bibliographies/Indexes
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Includes bibliographical references and index.
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| Contents
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Intro; Preface; Contents; List of Abbreviations and Symbols; Abbreviations; Symbols; List of Figures; List of Tables; 1 Radiation Effects in CMOS Technology; 1.1 Radiation and Its Interaction with Matter; 1.1.1 Direct Ionization; 1.1.2 Electromagnetic Radiation; 1.1.3 Neutrons; 1.1.4 Effects on Semiconductors; 1.2 Total Ionizing Dose Effects; 1.2.1 Basic Charge Trapping in CMOS Transistors; 1.2.2 Narrow Channel Transistors; 1.2.3 Short Channel Transistors; 1.2.4 Enclosed Layout Transistors; 1.2.5 Experimental Results; 1.3 Single-Event Effects; 1.3.1 Basic Mechanism.
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1.3.2 Effect on nmos and pmos Devices1.3.3 SET, SEU, SEL; 1.3.4 SEU Mitigation Techniques in Digital Blocks; 1.3.5 Charge Sharing; 1.4 Simulation Methods to Simulate Radiation Effects; 1.4.1 Simulation of TID Effects on Circuits; 1.4.2 Simulation of Single-Event Effects on Circuits; 1.5 Conclusion; 2 Time-Domain Signal Processing; 2.1 Introduction; 2.2 Time-to-Digital Converters; 2.3 Applications of Time-Based Circuits; 2.3.1 High-Energy Physics; 2.3.2 PET Scanners; 2.3.3 Time-of-Flight LIDAR; 2.3.4 All-Digital PLLs; 2.4 TDC Circuits; 2.4.1 Performance Parameters.
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2.4.1.1 Single-Shot Precision2.4.1.2 Linearity; 2.4.1.3 Gain Error; 2.4.1.4 Conversion Speed; 2.4.2 Delay-Line Based TDCs; 2.4.3 Sub-gate Delay-Line TDCs; 2.4.3.1 Vernier Architecture; 2.4.3.2 Local Phase Interpolation; 2.4.3.3 Parallel TDCs; 2.4.4 Delay-Locked Loops; 2.4.5 Multi-Stage TDCs; 2.4.5.1 Coarse-Fine TDCs; 2.4.5.2 Pipelined TDCs; 2.4.6 Looped TDCs; 2.4.7 Oversampling TDCs; 2.4.7.1 Gated Ring-Oscillator; 2.4.8 Other TDC Architectures; 2.4.8.1 Stochastic TDCs; 2.4.8.2 Wave Union Launcher; 2.4.9 Input Path; 2.5 Conclusion; 3 Clock Synthesizers; 3.1 Introduction; 3.2 Phase Locked Loops.
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3.2.1 Phase-Domain Model3.2.2 Components for Charge-Pump PLLs; 3.2.2.1 Phase Detector; 3.2.2.2 Phase-Frequency Detector; 3.2.2.3 Bang-Bang Phase Detector; 3.2.2.4 Charge-Pump: Loop Filter; 3.2.2.5 Divider; 3.3 Oscillators; 3.3.1 Oscillation Criteria; 3.3.2 LC-Oscillators; 3.3.3 Ring-Oscillators; 3.4 Jitter and Phase-Noise; 3.4.1 Definitions; 3.4.2 Phase Noise in LC-Tank Oscillators; 3.4.2.1 Linear Calculation; 3.4.2.2 Impulse Sensitive Function; 3.4.3 Phase Noise Spectrum of an Oscillator; 3.5 Phase-Noise in PLLs; 3.5.1 Noise Transfer Function; 3.5.2 Reference Clock Phase Noise.
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3.5.3 Charge-Pump: Loop Filter3.5.4 Oscillator; 3.5.5 Spurious Tones; 3.6 Performance Parameters; 3.7 Conclusion; 4 Single Shot Time-to-Digital Converters; 4.1 Introduction; 4.2 TDC System Level Architecture; 4.2.1 Self-Calibration Loop Implemented by a DLL; 4.2.2 System Architecture with Double Phase Detector; 4.2.3 TDC Timing Generator Linearity; 4.2.4 Channeling and Basic Readout Interfaces; 4.3 Low Offset Bang-Bang Phase Detector; 4.3.1 Origin of Static Phase Offsets; 4.3.2 Removing Static Phase Offsets; 4.3.3 Circuit Implementations; 4.4 Experimental Results; 4.5 Conclusion.
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| Abstract
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This book presents state-of-the-art techniques for radiation hardened high-resolution Time-to-Digital converters and low noise frequency synthesizers. Throughout the book, advanced degradation mechanisms and error sources are discussed and several ways to prevent such errors are presented. An overview of the prerequisite physics of nuclear interactions is given that has been compiled in an easy to understand chapter. The book is structured in a way that different hardening techniques and solutions are supported by theory and experimental data with their various tradeoffs. Based on leading-edge research, conducted in collaboration between KU Leuven and CERN, the European Center for Nuclear Research Describes in detail advanced techniques to harden circuits against ionizing radiation Provides a practical way to learn and understand radiation effects in time-based circuits Includes an introduction to the underlying physics, circuit design, and advanced techniques accompanied with experimental data.
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| Subject
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Integrated circuits.
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Metal oxide semiconductors, Complementary.
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Circuits components.
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Electronics engineering.
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Imaging systems technology.
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Integrated circuits.
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Metal oxide semiconductors, Complementary.
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TECHNOLOGY ENGINEERING-- Mechanical.
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| Dewey Classification
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621.3815
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| LC Classification
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TK7871.99.M44
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| Added Entry
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Leroux, Paul,1975-
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Steyaert, Michiel,1959-
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