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" Residual stresses and nanoindentation testing of films and coatings / "
by Haidou Wang, Lina Zhu, Binshi Xu.
Document Type
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BL
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Record Number
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889180
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Main Entry
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Wang, Haidou
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Title & Author
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Residual stresses and nanoindentation testing of films and coatings /\ by Haidou Wang, Lina Zhu, Binshi Xu.
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Publication Statement
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Singapore :: Springer,, 2018.
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Page. NO
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1 online resource (xii, 207 pages) :: illustrations (some color)
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ISBN
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9789811078415
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: 9811078416
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9789811078408
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9811078408
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Bibliographies/Indexes
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Includes bibliographical references.
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Contents
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Residual stresses of materials.- Principle and Methods of Nanoindentation Test.- Theoretical models for measuring residual stress by nanoindentation method.- Application of Suresh and Lee models in the measurement of residual stress of bulk materials -- Application of Suresh and Lee models in the measurement of residual stress of coatings -- Application of Suresh and Lee models in the measurement of residual stress of films.- Application of other models in the measurement of residual stress.
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Abstract
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This book covers the basic principles and application of nanoindentation technology to determine residual stresses in films and coatings. It briefly introduces various detection technologies for measuring residual stresses, while mainly focusing on nanoindentation. Subsequently, nanoindentation is used to determine residual stresses in different types of films and coatings, and to describe them in detail. This book is intended for specialists, engineers and graduate students in mechanical design, manufacturing, maintenance and remanufacturing, and as a guide to the practice of production with social and economic benefits.
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Subject
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Continuum mechanics.
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Subject
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Materials science.
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Subject
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Nanotechnology.
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Subject
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Residual stresses.
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Subject
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Surfaces (Technology)
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Subject
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Thin films.
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Subject
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Continuum mechanics.
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Subject
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Materials science.
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Subject
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Nanotechnology.
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Subject
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Residual stresses.
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Subject
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Surfaces (Technology)
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Subject
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TECHNOLOGY ENGINEERING-- Engineering (General)
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Subject
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TECHNOLOGY ENGINEERING-- Reference.
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Subject
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Thin films.
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Dewey Classification
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620.1/127
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LC Classification
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TA404.6
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Added Entry
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Xu, Binshi
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Zhu, Lina
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