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" Progress in nanoscale characterization and manipulation / "
Rongming Wang, Chen Wang, Hongzhou Zhang, Jing Tao, Xuedong Bai, editors.
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BL
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| Record Number
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889621
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| Title & Author
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Progress in nanoscale characterization and manipulation /\ Rongming Wang, Chen Wang, Hongzhou Zhang, Jing Tao, Xuedong Bai, editors.
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| Publication Statement
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Singapore :: Springer,, 2018.
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| Series Statement
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Springer tracts in modern physics,; volume 272
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| Page. NO
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1 online resource (vii, 508 pages) :: illustrations (some color).
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| ISBN
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9789811304545
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: 9811304548
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9789811304538
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981130453X
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| Contents
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Electron/Ion Optics -- Scanning Electron Microscopy -- Transmission Electron Microscopy -- Scanning Transmission Electron Microscopy (STEM) -- Spectroscopy -- Aberration Corrected Transmission Electron Microscopy and Its Applications -- In situ TEM: Theory and Applications -- Helium Ion Microscopy.
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| Abstract
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This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research. The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field.
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Electron microscopy.
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Nanostructured materials-- Optical properties.
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Electron microscopy.
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Nanostructured materials-- Optical properties.
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Nanotechnology.
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Science-- Nanostructures.
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Science-- Spectroscopy Spectrum Analysis.
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Spectrum analysis, spectrochemistry, mass spectrometry.
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Technology Engineering-- Material Science.
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Testing of materials.
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Physics.
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Characterization and Evaluation of Materials.
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Nanoscale Science and Technology.
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Spectroscopy and Microscopy.
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| Dewey Classification
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502.8/25
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| LC Classification
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QH212.E4
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| Added Entry
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Bai, Xuedong
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Tao, Jing
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Wang, Chen
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Wang, Rongming
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Zhang, Hongzhou
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