A measurement-based appearance model for fabrics

منو

" A measurement-based appearance model for fabrics "
Bisker, Oleg

Document Type	:	Latin Dissertation
Language of Document	:	English
Record Number	:	913831
Doc. No	:	TL1n4501jb
Main Entry	:	Bisker, Oleg
Title & Author	:	A measurement-based appearance model for fabrics\ Bisker, Oleg
College	:	UC San Diego
Date	:	2012
student score	:	2012
Abstract	:	Accurate representations of real-world materials are a crucial prerequisite for realistic image synthesis. This thesis presents a method for rendering fabric based on a low-level simulation of light scattering from threads. Making use of reflectance acquisition techniques, we study the reflectance characteristics of a variety of threads extracted from real-world fabrics. We introduce a model for light scattering from threads which simulates both the surface and subsurface transport of light. The model's accuracy is assessed against physical measurements. In order to generate an image of fabric, we propose a weave pattern and thread curve encoding that enables us to mimic the structure of a wide variety of fabrics. We apply this appearance model in a path tracing framework to realistically reproduce the appearance of fabrics
Added Entry	:	UC San Diego