| Document Type
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BL
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| Record Number
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951825
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| Doc. No
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b706195
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| Main Entry
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Wang, Zhong Lin
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| Title & Author
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Reflection electron microscopy and spectroscopy for surface analysis /\ Zhong Lin Wang.
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| Publication Statement
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Cambridge :: Cambridge University Press,, 1996.
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| Page. NO
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1 online resource (xix, 436 pages) :: PDF file(s).
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| ISBN
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0511525257
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: 9780511525254
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9780521017954 (paperback)
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9780521482660 (hardback)
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| Notes
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Title from publisher's bibliographic system (viewed on 05 Oct 2015).
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| Abstract
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In this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy loss spectra in different scattering geometries. This and many other features make the book an important and timely addition to the materials science literature.
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| Subject
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Materials-- Microscopy.
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| Subject
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Reflection electron microscopy.
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Surfaces (Technology)-- Analysis.
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| Subject
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Materials-- Microscopy.
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| Subject
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Reflection electron microscopy.
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| Subject
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Surfaces (Technology)-- Analysis.
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| Dewey Classification
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620/.44
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| LC Classification
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TA417.23.W36 1996
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| Parallel Title
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Reflection Electron Microscopy & Spectroscopy for Surface Analysis
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