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" Digital systems testing and testable design / "
Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman.
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BL
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| Record Number
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956537
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b710907
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| Main Entry
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Abramovici, Miron.
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| Title & Author
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Digital systems testing and testable design /\ Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman.
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| Edition Statement
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Revised Printing
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| Publication Statement
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New York, NY :: IEEE ;Hoboken, New Jersey :: Wiley-Interscience,, [1994]
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, ©1990
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| Page. NO
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1 online resource (xxii, 652 pages) :: illustrations
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| ISBN
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0470544384
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: 9780470544389
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0780310624
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9780780310629
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| Notes
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"This is the IEEE revised printing of the book previously published by W. H. Freeman and Company in 1990 under the title Digital Systems Testing and Testable Design."--Title page verso.
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| Bibliographies/Indexes
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Includes bibliographical references and index.
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| Subject
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Digital integrated circuits-- Design and construction.
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Digital integrated circuits-- Testing.
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Digital integrated circuits-- Design and construction.
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Digital integrated circuits-- Testing.
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| Dewey Classification
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621.381/5
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| LC Classification
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TK7874.A23 1990b
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| Added Entry
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Breuer, Melvin A.
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Friedman, Arthur D.
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